Search Results for Accelerated life testing. - Narrowed by: EnglishSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dAccelerated$002blife$002btesting.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026ps$003d300?2025-12-25T08:12:25ZPrediction Technologies for Improving Engineering Product Efficiencyent://SD_ILS/0/SD_ILS:5270292025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor Klyatis, Lev M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-16655-6">https://doi.org/10.1007/978-3-031-16655-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design of Mechanical Systems Accelerated Lifecycle Testing and Reliabilityent://SD_ILS/0/SD_ILS:5268292025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor Woo, Seongwoo. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-28938-5">https://doi.org/10.1007/978-3-031-28938-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Service Life Prediction of Exterior Plastics Vision for the Futureent://SD_ILS/0/SD_ILS:5292402025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor White, Christopher C. editor. Martin, Jon. editor. Chapin, J. Thomas. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-06034-7">https://doi.org/10.1007/978-3-319-06034-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Numerical Methods for Reliability and Safety Assessment Multiscale and Multiphysics Systemsent://SD_ILS/0/SD_ILS:5292772025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor Kadry, Seifedine. editor. El Hami, Abdelkhalak. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-07167-1">https://doi.org/10.1007/978-3-319-07167-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Green building, materials and civil engineering : proceedings of the 4th International Conference on Green Building, Materials and Civil Engineering (GBMCE 2014), Hong Kong, 21-22 August 2014ent://SD_ILS/0/SD_ILS:5433622025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor International Conference on Green Building, Materials and Civil Engineering (GBMCE) (4th : 2014 : Hong Kong). Author. Kao, Jimmy C. M. (Jimmy Chih-Ming), 1963- editor. Sung, Wen-Pei, editor. Chen, Ran, Dr., editor.<br/>Preferred Shelf Number TH880 .I58 2014<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315751986">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Accelerated reliability and durability testing technologyent://SD_ILS/0/SD_ILS:2978272025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor Klyatis, Lev M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
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<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in pavement design through full-scale accelerated pavement testing : proceedings of the 4th International Conference on Accelerated Pavement Testing, Davis, CA, USA, 19-21 September 2012ent://SD_ILS/0/SD_ILS:5423092025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor International Conference on Accelerated Pavement Testing (4th : 2012 : Davis, Calif.) Jones, David.<br/>Preferred Shelf Number TE250 .I58 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135101800">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>The Weibull distribution : a handbookent://SD_ILS/0/SD_ILS:5450272025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor Rinne, Horst., author.<br/>Preferred Shelf Number QA273.6 .R56 2008<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420087444">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Coatings technology : fundamentals, testing, and processing techniquesent://SD_ILS/0/SD_ILS:5470362025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor Tracton, Arthur A.<br/>Preferred Shelf Number TP156 .C57 C616 2007<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420044089">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Accelerated quality and reliability solutionsent://SD_ILS/0/SD_ILS:2544152025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor Klyatis, Lev M. Klyatis, Eugene L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Engineering design reliability handbookent://SD_ILS/0/SD_ILS:5442082025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren.<br/>Preferred Shelf Number TA174 .E544 2005<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135513825">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Accelerated testing and validation testing, engineering, and management tools for lean developmentent://SD_ILS/0/SD_ILS:2541842025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor Porter, Alex.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design and analysis of accelerated tests for mission critical reliabilityent://SD_ILS/0/SD_ILS:5462542025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.<br/>Preferred Shelf Number TA169.3 .L88 2004<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Accelerated life models : modeling and statistical analysisent://SD_ILS/0/SD_ILS:5438282025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor Bagdonavicius, V. (Vilijandas), author. Nikulin, M. S. (Mikhail Stepanovich)<br/>Preferred Shelf Number TA169.3 .N55 2002<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420035872">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>High Voltage Engineering and Testingent://SD_ILS/0/SD_ILS:2478962025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor Ryan, Hugh M., ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBPO032E">http://dx.doi.org/10.1049/PBPO032E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Accelerated testing statistical models, test plans and data analysesent://SD_ILS/0/SD_ILS:2952592025-12-25T08:12:25Z2025-12-25T08:12:25ZAuthor Nelson, Wayne, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a>
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HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/20454343.html">http://catalog.hathitrust.org/api/volumes/oclc/20454343.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>