Search Results for Accelerated life testing. - Narrowed by: Reliability (Engineering)
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dAccelerated$002blife$002btesting.$0026qf$003dSUBJECT$002509Subject$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ps$003d300?dt=list
2026-03-21T02:53:50Z
Photovoltaic module reliability
ent://SD_ILS/0/SD_ILS:595739
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Author Wohlgemuth, J. (John), 1946- author.<br/>Preferred Shelf Number TK8322<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability engineering and services
ent://SD_ILS/0/SD_ILS:594657
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2026-03-21T02:53:50Z
Author Jin, Tongdan, author.<br/>Preferred Shelf Number TS173 .J56 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
ent://SD_ILS/0/SD_ILS:593728
2026-03-21T02:53:50Z
2026-03-21T02:53:50Z
Author Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number TA169.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Accelerated reliability and durability testing technology
ent://SD_ILS/0/SD_ILS:297827
2026-03-21T02:53:50Z
2026-03-21T02:53:50Z
Author Klyatis, Lev M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
ebrary <a href="http://site.ebrary.com/id/10592157">http://site.ebrary.com/id/10592157</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Accelerated testing and validation testing, engineering, and management tools for lean development
ent://SD_ILS/0/SD_ILS:254184
2026-03-21T02:53:50Z
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Author Porter, Alex.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design and analysis of accelerated tests for mission critical reliability
ent://SD_ILS/0/SD_ILS:546254
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Author LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.<br/>Preferred Shelf Number TA169.3 .L88 2004<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>