SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dAiche$0026qf$003dPUBDATE$002509Publication$002bDate$0025092003$0025092003$0026pe$003dd$00253A$0026ic$003dtrue$0026ps$003d300? 2024-11-08T10:01:06Z ent://SD_ILS/0/SD_ILS:226218 2024-11-08T10:01:06Z 2024-11-08T10:01:06Z Author&#160;American Institute of Chemical Engineers.&#160;Wiley<br/>Preferred Shelf Number&#160;ALFABET&#304;K V.42 PART.3 1996<br/>Electronic Access&#160;<a href="http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1547-5905">Elektronik eri?im</a><br/>Format:&#160;Continuing Resources&#160;Other<br/>Availability&#160;Beytepe Library~65&#160;~0<br/> ent://SD_ILS/0/SD_ILS:301213 2024-11-08T10:01:06Z 2024-11-08T10:01:06Z Author&#160;American Institute of Chemical Engineers. Equipment Testing Procedures Committee.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470924792">Access restricted to McGill users</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470924792">http://dx.doi.org/10.1002/9780470924792</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>