Search Results for Analyse. - Narrowed by: Electronics. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dAnalyse.$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026ic$003dtrue$0026ps$003d300? 2026-02-25T21:32:09Z Elektromagnetische Vertr&auml;glichkeit in der Praxis Design-Analyse - Interpretation der Normen - Bewertung der Pr&uuml;fergebnisse ent://SD_ILS/0/SD_ILS:337090 2026-02-25T21:32:09Z 2026-02-25T21:32:09Z Author&#160;Stotz, Dieter. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(337090.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-34345-2">http://dx.doi.org/10.1007/978-3-642-34345-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Analyse linearer und nichtlinearer elektrischer Schaltungen Ein Kompendium ent://SD_ILS/0/SD_ILS:198912 2026-02-25T21:32:09Z 2026-02-25T21:32:09Z Author&#160;Gr&auml;&szlig;er, Andreas. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-8348-2370-0">http://dx.doi.org/10.1007/978-3-8348-2370-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Repairable systems reliability analysis : a comprehensive framework ent://SD_ILS/0/SD_ILS:596328 2026-02-25T21:32:09Z 2026-02-25T21:32:09Z Author&#160;Rai, Rajiv Nandan, author.&#160;Chaturvedi, Sanjay K., author.&#160;Bolia, Nomesh, author.<br/>Preferred Shelf Number&#160;QA402 .R35 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The ESD control program handbook ent://SD_ILS/0/SD_ILS:595961 2026-02-25T21:32:09Z 2026-02-25T21:32:09Z Author&#160;Smallwood, J. M. (Jeremy M.), author.<br/>Preferred Shelf Number&#160;TK7870<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118694541">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118694541</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Social-behavioral modeling for complex systems ent://SD_ILS/0/SD_ILS:594823 2026-02-25T21:32:09Z 2026-02-25T21:32:09Z Author&#160;Davis, Paul K., 1943- editor.&#160;O'Mahony, Angela, editor.&#160;Pfautz, Jonathan, editor.<br/>Preferred Shelf Number&#160;HA29 .S6736 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119485001">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119485001</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Emergent behavior in complex systems engineering : a modeling and simulation approach ent://SD_ILS/0/SD_ILS:594206 2026-02-25T21:32:09Z 2026-02-25T21:32:09Z Author&#160;Mittal, Saurabh, editor.&#160;Diallo, Saikou Y., editor.&#160;Tolk, Andreas, editor.<br/>Preferred Shelf Number&#160;TA168 .E53 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119378952">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119378952</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment ent://SD_ILS/0/SD_ILS:593728 2026-02-25T21:32:09Z 2026-02-25T21:32:09Z Author&#160;Modarres, M. (Mohammad), author.&#160;Amiri, Mehdi, author.&#160;Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number&#160;TA169.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>