Search Results for Analysis. - Narrowed by: Reliability (Engineering) SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dAnalysis.$0026qf$003dSUBJECT$002509Konu$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ic$003dtrue$0026ps$003d300? 2026-02-19T15:32:54Z Applied life data analysis ent://SD_ILS/0/SD_ILS:300248 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Nelson, Wayne, 1936-&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471725234">http://dx.doi.org/10.1002/0471725234</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical engineering failure analysis ent://SD_ILS/0/SD_ILS:545309 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Tawancy, Hani M., author.&#160;Abbas, Nureddin Mohamed.&#160;Ul-Hamid, Anwar.<br/>Preferred Shelf Number&#160;TA169.5 .T39 2004<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135523695">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability analysis of modern power systems ent://SD_ILS/0/SD_ILS:599018 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Saket, R. K., editor.&#160;Sanjeevikumar, Padmanaban, 1978-<br/>Preferred Shelf Number&#160;TA169 .S234 2024<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability analysis using MINITAB and Python ent://SD_ILS/0/SD_ILS:597824 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Hwang, Jaejin, author.<br/>Preferred Shelf Number&#160;TA169 .H93 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Structural reliability analysis and prediction ent://SD_ILS/0/SD_ILS:593807 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Melchers, R. E. (Robert E.), 1945- author.&#160;Beck, Andr&eacute; T., author.<br/>Preferred Shelf Number&#160;TA656.5 .M45 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Risk analysis in engineering and economics ent://SD_ILS/0/SD_ILS:545726 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Ayyub, Bilal M., author.<br/>Preferred Shelf Number&#160;T174.5 .A99 2014<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781466518261">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Risk analysis in engineering and economics ent://SD_ILS/0/SD_ILS:539259 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Ayyub, Bilal M., author.<br/>Preferred Shelf Number&#160;T174.5 .A98 2003<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135438999">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Repairable systems reliability analysis : a comprehensive framework ent://SD_ILS/0/SD_ILS:596328 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Rai, Rajiv Nandan, author.&#160;Chaturvedi, Sanjay K., author.&#160;Bolia, Nomesh, author.<br/>Preferred Shelf Number&#160;QA402 .R35 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advanced risk analysis in engineering enterprise systems ent://SD_ILS/0/SD_ILS:538759 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Pinto, Cesar Ariel., author.&#160;Garvey, Paul R., 1956-<br/>Preferred Shelf Number&#160;TA169 .P56 2013<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439826157">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Hydrosystems engineering reliability assessment and risk analysis ent://SD_ILS/0/SD_ILS:293215 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Tung, Yeou-Koung.&#160;Yen, Ben Chie, 1935-&#160;Melching, Charles S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/hydrosystems-engineering-reliability-assessment-risk-analysis">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Cognitive reliability and error analysis method CREAM ent://SD_ILS/0/SD_ILS:254433 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Hollnagel, Erik, 1941-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080428482">http://www.sciencedirect.com/science/book/9780080428482</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fracture mechanics. 1, Analysis of reliability and quality control ent://SD_ILS/0/SD_ILS:305424 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Grous, Ammar, author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118580004">http://dx.doi.org/10.1002/9781118580004</a> Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118580004">http://onlinelibrary.wiley.com/book/10.1002/9781118580004</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Designing faultless mechanical products based on advanced reliability analysis ent://SD_ILS/0/SD_ILS:590951 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Woo, Seongwoo, 1966- author.<br/>Preferred Shelf Number&#160;TS173<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003451471">https://www.taylorfrancis.com/books/9781003451471</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> What every engineer should know about reliability and risk analysis ent://SD_ILS/0/SD_ILS:565637 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Modarres, M. (Mohammad), author.&#160;Groth, Katrina, author.<br/>Preferred Shelf Number&#160;TA169 .M63 2023<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003307495">https://www.taylorfrancis.com/books/9781003307495</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability analysis, safety assessment and optimization : methods and applications in energy systems and other applications ent://SD_ILS/0/SD_ILS:597447 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Zio, Enrico, author.&#160;Li, Yan-Fu, author.<br/>Preferred Shelf Number&#160;TA169 .Z57 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dynamic system reliability : modelling and analysis of dynamic and dependent behaviors ent://SD_ILS/0/SD_ILS:595289 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Xing, Liudong, author.&#160;Levitin, Gregory, author.&#160;Wang, Chaonan, 1986- author.<br/>Preferred Shelf Number&#160;TA169 .X56 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119507642">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119507642</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Guidelines for failure modes and effects analysis for medical devices ent://SD_ILS/0/SD_ILS:543242 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;PRESS, DYADEM.<br/>Preferred Shelf Number&#160;R856.6<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429205804">https://www.taylorfrancis.com/books/9780429205804</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability engineering and risk analysis : a practical guide ent://SD_ILS/0/SD_ILS:363877 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Modarres, M. (Mohammad)&#160;Kaminskiy, Mark, 1946-&#160;Krivtsov, Vasiliy, 1963-<br/>Preferred Shelf Number&#160;TA169 M627 2010<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Practical reliability engineering and analysis for system design and life-cycle sustainment ent://SD_ILS/0/SD_ILS:547196 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Wessels, William R., author.<br/>Preferred Shelf Number&#160;TS173 .W45 2010<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420094404">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability analysis and prediction with warranty data : issues, strategies, and methods ent://SD_ILS/0/SD_ILS:543197 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Rai, Bharatendra K., author.&#160;Singh, Nanua.<br/>Preferred Shelf Number&#160;K1032 .C6 R35 2009<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439803264">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Risk-based reliability analysis and generic principles for risk reduction ent://SD_ILS/0/SD_ILS:148956 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Todinov, M. T.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Risk analysis in engineering : techniques, tools, and trends ent://SD_ILS/0/SD_ILS:119534 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Modarres, Mohammad.<br/>Preferred Shelf Number&#160;T174.5 M65 2006<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Uncertainty modeling and analysis in engineering and the sciences ent://SD_ILS/0/SD_ILS:544184 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Ayyub, Bilal M., author.&#160;Klir, George J., 1932-<br/>Preferred Shelf Number&#160;TA330 .A995 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420011456">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Design and analysis of accelerated tests for mission critical reliability ent://SD_ILS/0/SD_ILS:546254 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;LuValle, Michael J., author.&#160;Lefevre, Bruce G.&#160;Kannan, SriRaman.<br/>Preferred Shelf Number&#160;TA169.3 .L88 2004<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability verification, testing and analysis in engineering design ent://SD_ILS/0/SD_ILS:547339 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Wasserman, Gary S., 1951, author.<br/>Preferred Shelf Number&#160;TA169 .W37 2003<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135551483">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Guidelines for failure mode and effects analysis for automotive, aerospace and general manufacturing industries ent://SD_ILS/0/SD_ILS:540286 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Dyadem Press.<br/>Preferred Shelf Number&#160;TS156 .G795 2003<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135495480">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> The design analysis handbook a practical guide to design validation ent://SD_ILS/0/SD_ILS:254797 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Walker, N. Edward.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750690881">http://www.sciencedirect.com/science/book/9780750690881</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Architecting resilient systems ent://SD_ILS/0/SD_ILS:599418 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Jackson, Scott, author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394258239">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394258239</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design and manufacturing practices for performability engineering ent://SD_ILS/0/SD_ILS:600102 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Chaturvedi, Sanjay K., editor.&#160;Gargama, Heeralal, editor.&#160;Rai, Rajiv N., editor.<br/>Preferred Shelf Number&#160;TS171 .D47 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394345731">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394345731</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Multi-physics optimization : mechanics, fluid interaction structure, shaping, stochastic finite elements, random vibrations, fatigue ent://SD_ILS/0/SD_ILS:600124 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;El Hami, Abdelkhalak, author.&#160;Radi, Boucha&iuml;b, author.<br/>Preferred Shelf Number&#160;TA347 .F5 E43 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394401727">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394401727</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computational intelligence in sustainable reliability engineering ent://SD_ILS/0/SD_ILS:598272 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Malik, S. C., editor.<br/>Preferred Shelf Number&#160;TA169 .C65 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied reliability for industry. 2, Experimental reliability for the automobile, aeronautics, defense, medical, marine and space industries ent://SD_ILS/0/SD_ILS:598326 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;El Hami, Abdelkhalak, editor.&#160;Delaux, David, editor.&#160;Grzeskowiak, Henri, editor.<br/>Preferred Shelf Number&#160;TA169 .A67 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and maintenance modeling with optimization : advances and applications ent://SD_ILS/0/SD_ILS:562446 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Kimura, Mitsutaka, editor.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003095231">https://www.taylorfrancis.com/books/9781003095231</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Product maturity. 1, Theoretical principals and industrial applications ent://SD_ILS/0/SD_ILS:597455 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Bayle, Franck, author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and Physics-Of-Healthy in Mechatronics. ent://SD_ILS/0/SD_ILS:598146 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;El Hami, Abdelkhalak.&#160;Delaux, David.&#160;Grzeskowiak, Henri.<br/>Preferred Shelf Number&#160;TA169 .E515 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability culture : how leaders build organizations that create reliable products ent://SD_ILS/0/SD_ILS:596268 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Bahret, Adam P., 1973- author.<br/>Preferred Shelf Number&#160;TS156 .B335 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119612483">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119612483</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Photovoltaic module reliability ent://SD_ILS/0/SD_ILS:595739 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Wohlgemuth, J. (John), 1946- author.<br/>Preferred Shelf Number&#160;TK8322<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of maintained systems subjected to wear failure mechanisms : theory and applications ent://SD_ILS/0/SD_ILS:595240 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Bayle, Franck, author.<br/>Preferred Shelf Number&#160;TA169<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment ent://SD_ILS/0/SD_ILS:593728 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Modarres, M. (Mohammad), author.&#160;Amiri, Mehdi, author.&#160;Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number&#160;TA169.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamentals of reliability engineering : applications in multistage interconnection networks ent://SD_ILS/0/SD_ILS:342010 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Gunawan, Indra.<br/>Preferred Shelf Number&#160;ONLINE(342010.1)<br/>Electronic Access&#160;Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a> Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079">http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079</a> Ebook Library <a href="http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0">http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0</a> ebrary <a href="http://site.ebrary.com/id/10843879">http://site.ebrary.com/id/10843879</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design decisions under uncertainty with limited information ent://SD_ILS/0/SD_ILS:544270 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Nikolaidis, Efstratios, author.&#160;Mourelatos, Zissimos P.&#160;Pandey, Vijitashwa.<br/>Preferred Shelf Number&#160;TA174 .N55 2011<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781136853296">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Human reliability assessment : theory and practice ent://SD_ILS/0/SD_ILS:540046 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Spurgin, Anthony J., author.<br/>Preferred Shelf Number&#160;TA166 .S685 2010<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420068528">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Human reliability, error, and human factors in engineering maintenance : with reference to aviation and power generation ent://SD_ILS/0/SD_ILS:547574 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number&#160;TA167 .D468 2009<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439803844">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Engineering design reliability applications : for the aerospace, automotive, and ship industries ent://SD_ILS/0/SD_ILS:539978 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Preferred Shelf Number&#160;TA174 .E54 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420051339">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability, quality, and safety for engineers ent://SD_ILS/0/SD_ILS:547810 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number&#160;TS173 .D495 2005<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135484071">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Accelerated testing and validation testing, engineering, and management tools for lean development ent://SD_ILS/0/SD_ILS:254184 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Porter, Alex.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Medical device reliability and associated areas ent://SD_ILS/0/SD_ILS:540912 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number&#160;R855.3 .D47 2000<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420042238">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Design reliability : fundamentals and applications ent://SD_ILS/0/SD_ILS:540572 2026-02-19T15:32:54Z 2026-02-19T15:32:54Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;TA174 .D4929 1999<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>