Search Results for Application-specific integrated circuits. - Narrowed by: Integrated circuits--Testing.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dApplication-specific$002bintegrated$002bcircuits.$0026qf$003dSUBJECT$002509Subject$002509Integrated$002bcircuits--Testing.$002509Integrated$002bcircuits--Testing.$0026ic$003dtrue$0026ps$003d300?
2024-09-10T04:19:06Z
Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach
ent://SD_ILS/0/SD_ILS:247757
2024-09-10T04:19:06Z
2024-09-10T04:19:06Z
Author Yichuang Sun, ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS019E">http://dx.doi.org/10.1049/PBCS019E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
VLSI Testing Digital and mixed analogue/digital techniques
ent://SD_ILS/0/SD_ILS:247747
2024-09-10T04:19:06Z
2024-09-10T04:19:06Z
Author Hurst, Stanley L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS009E">http://dx.doi.org/10.1049/PBCS009E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Algorithmic and Knowledge-based CAD for VLSI
ent://SD_ILS/0/SD_ILS:247743
2024-09-10T04:19:06Z
2024-09-10T04:19:06Z
Author Taylor, Gaynor, ed. Russell, Gordon, ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS004E">http://dx.doi.org/10.1049/PBCS004E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>