Search Results for Applied statistics - Narrowed by: 1987
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Quality control and applied statistics.
ent://SD_ILS/0/SD_ILS:228036
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Author Executive Sciences Institute.<br/>Preferred Shelf Number ALFABETİK V.17 1972<br/>Format: Continuing Resources Other<br/>Availability Beytepe Library~11 ~0<br/>
Applied statistics and the SAS programming language
ent://SD_ILS/0/SD_ILS:72871
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Author Cody, Ronald P. Smith, Jeffrey K., ort. yaz.<br/>Preferred Shelf Number QA 276.4 C53 1987<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Applied business statistics : text, problems and cases
ent://SD_ILS/0/SD_ILS:10569
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Author Campbell, Stephen Kent<br/>Preferred Shelf Number HF 1017 C36 1987<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Multiple comparison procedures
ent://SD_ILS/0/SD_ILS:295251
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Author Hochberg, Yosef. Tamhane, Ajit C. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470316672">http://dx.doi.org/10.1002/9780470316672</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Multiple imputation for nonresponse in surveys
ent://SD_ILS/0/SD_ILS:295252
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Author Rubin, Donald B. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469854">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469854</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316696">http://dx.doi.org/10.1002/9780470316696</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nonlinear statistical models
ent://SD_ILS/0/SD_ILS:295253
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Author Gallant, A. Ronald, 1942- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469411">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469411</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316719">http://dx.doi.org/10.1002/9780470316719</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/14069052.html">http://catalog.hathitrust.org/api/volumes/oclc/14069052.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Stochastic simulation
ent://SD_ILS/0/SD_ILS:295254
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Author Ripley, Brian D., 1952- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469837">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469837</a>
HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/13822487.html">http://catalog.hathitrust.org/api/volumes/oclc/13822487.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316726">http://dx.doi.org/10.1002/9780470316726</a>
Safari Books Online <a href="http://proquest.safaribooksonline.com/?fpi=9780470009604">http://proquest.safaribooksonline.com/?fpi=9780470009604</a>
Volltext <a href="http://proquest.tech.safaribooksonline.de/9780470009604">http://proquest.tech.safaribooksonline.de/9780470009604</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Robust regression and outlier detection
ent://SD_ILS/0/SD_ILS:300253
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Author Rousseeuw, Peter J. Leroy, Annick M. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0471725382">http://dx.doi.org/10.1002/0471725382</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>