Search Results for Applied statistics - Narrowed by: 2023 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dApplied$002bstatistics$0026qf$003dPUBDATE$002509Publication$002bDate$0025092023$0025092023$0026ps$003d300?dt=list 2026-01-13T10:46:32Z Quality control and applied statistics. ent://SD_ILS/0/SD_ILS:228036 2026-01-13T10:46:32Z 2026-01-13T10:46:32Z Author&#160;Executive Sciences Institute.<br/>Preferred Shelf Number&#160;ALFABET&#304;K V.17 1972<br/>Format:&#160;Continuing Resources&#160;Other<br/>Availability&#160;Beytepe Library~11&#160;~0<br/> Outliers in statistical data ent://SD_ILS/0/SD_ILS:86151 2026-01-13T10:46:32Z 2026-01-13T10:46:32Z Author&#160;Barnett, Vic.&#160;Lewis, Toby, ort. yaz.<br/>Preferred Shelf Number&#160;QA 276 B2849 1994<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Sparse graphical modeling for high dimensional data : a paradigm of conditional independence tests ent://SD_ILS/0/SD_ILS:582536 2026-01-13T10:46:32Z 2026-01-13T10:46:32Z Author&#160;Liang, F. (Faming), 1970- author.&#160;Jia, Bochao, author.<br/>Preferred Shelf Number&#160;QA279<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429061189">https://www.taylorfrancis.com/books/9780429061189</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> ENERGY OF DATA AND DISTANCE CORRELATION ent://SD_ILS/0/SD_ILS:569966 2026-01-13T10:46:32Z 2026-01-13T10:46:32Z Author&#160;Sz&eacute;kely, G&aacute;bor J., 1947- author.&#160;Rizzo, Maria L., author.<br/>Preferred Shelf Number&#160;QA276.4<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429157158">https://www.taylorfrancis.com/books/9780429157158</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bayesian nonparametrics for causal inference and missing data ent://SD_ILS/0/SD_ILS:561295 2026-01-13T10:46:32Z 2026-01-13T10:46:32Z Author&#160;Daniels, M. J. (Michael Joseph), author.&#160;Linero, Antonio, author.&#160;Roy, Jason (Jason Allen), author.<br/>Preferred Shelf Number&#160;QA279.5<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429324222">https://www.taylorfrancis.com/books/9780429324222</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computational Science and Its Applications - ICCSA 2023 Workshops Athens, Greece, July 3-6, 2023, Proceedings, Part II ent://SD_ILS/0/SD_ILS:521298 2026-01-13T10:46:32Z 2026-01-13T10:46:32Z Author&#160;Gervasi, Osvaldo. editor. (orcid)&#160;Murgante, Beniamino. editor. (orcid)&#160;Rocha, Ana Maria A. C. editor. (orcid)&#160;Garau, Chiara. editor. (orcid)&#160;Scorza, Francesco. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-37108-0">https://doi.org/10.1007/978-3-031-37108-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Annual Report on the Big Data of New Energy Vehicle in China (2021) ent://SD_ILS/0/SD_ILS:526898 2026-01-13T10:46:32Z 2026-01-13T10:46:32Z Author&#160;Wang, Zhenpo. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-19-5508-2">https://doi.org/10.1007/978-981-19-5508-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modern Survival Analysis in Clinical Research Cox Regressions Versus Accelerated Failure Time Models ent://SD_ILS/0/SD_ILS:527737 2026-01-13T10:46:32Z 2026-01-13T10:46:32Z Author&#160;Cleophas, Ton J. author.&#160;Zwinderman, Aeilko H. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-31632-6">https://doi.org/10.1007/978-3-031-31632-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Artificial Intelligence for Smart Manufacturing Methods, Applications, and Challenges ent://SD_ILS/0/SD_ILS:527797 2026-01-13T10:46:32Z 2026-01-13T10:46:32Z Author&#160;Tran, Kim Phuc. editor. (orcid)0000-0002-6005-1497&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-30510-8">https://doi.org/10.1007/978-3-031-30510-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>