Search Results for Automatic test equipment.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dAutomatic$002btest$002bequipment.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?dt=list
2026-03-21T23:07:48Z
Desıgn of a microcoontroller based FM receiver / transmitter automatic test equipment
ent://SD_ILS/0/SD_ILS:24503
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Author Gemalmaz, Ufuk.<br/>Preferred Shelf Number TEZ 1441 G46 1989<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Proceedings of the International Conference on Information Control, Electrical Engineering and Rail Transit ICEERT 2022
ent://SD_ILS/0/SD_ILS:528825
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Author Yadav, Sanjay. editor. Kumar, Rahul. editor. Zainuddin, Hidayat. editor. Deng, Lvxiang. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-6431-4">https://doi.org/10.1007/978-981-99-6431-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Robotic non-destructive testing technology
ent://SD_ILS/0/SD_ILS:557744
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Author Xu, Chunguang, 1964- author.<br/>Preferred Shelf Number TA417.2<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003212232">https://www.taylorfrancis.com/books/9781003212232</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Machine learning-based fault diagnosis for industrial engineering systems
ent://SD_ILS/0/SD_ILS:560725
2026-03-21T23:07:48Z
2026-03-21T23:07:48Z
Author Yang, Rui (Professor of computer engineering), author. Zhong, Maiying, author.<br/>Preferred Shelf Number TA169.6<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003240754">https://www.taylorfrancis.com/books/9781003240754</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Demystifying mixed-signal test methods
ent://SD_ILS/0/SD_ILS:254711
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2026-03-21T23:07:48Z
Author Baker, Mark.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750676168">http://www.sciencedirect.com/science/book/9780750676168</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Multisensor instrumentation 6[sigma] design defined accuracy computer-integrated measurement systems
ent://SD_ILS/0/SD_ILS:301456
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2026-03-21T23:07:48Z
Author Garrett, Patrick H.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0471221554">http://dx.doi.org/10.1002/0471221554</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/2001046730.html">http://catdir.loc.gov/catdir/bios/wiley043/2001046730.html</a>
ebrary <a href="http://site.ebrary.com/id/10299172">http://site.ebrary.com/id/10299172</a>
HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/47971537.html">http://catalog.hathitrust.org/api/volumes/oclc/47971537.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>