Search Results for Bayesian Analysis. - Narrowed by: Wiley E-Book Collection SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dBayesian$002bAnalysis.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AWILEY$002509Wiley$002bE-Book$002bCollection$0026ps$003d300$0026isd$003dtrue? 2026-01-21T23:21:46Z Financial data analytics with machine learning, optimization and statistics ent://SD_ILS/0/SD_ILS:599488 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Chen, Yongzhao, author.&#160;Cheung, Ka Chun, author.&#160;Fan, Kaiser, author.&#160;Yam, Phillip (Sheung Chi Phillip), author.<br/>Preferred Shelf Number&#160;HG104 .C44 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119863403">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119863403</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Super resolution optical imaging and microscopy : methods, algorithms, and applications ent://SD_ILS/0/SD_ILS:598852 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Qu, Junle, editor&#160;Yang, Zhigang, editor<br/>Preferred Shelf Number&#160;TA1632<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527835539">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527835539</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Paleontological data analysis ent://SD_ILS/0/SD_ILS:599056 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Hammer, &Oslash;yvind, 1968- author.&#160;Harper, D. A. T., author.<br/>Preferred Shelf Number&#160;QE721.2 .D37<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119933960">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119933960</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> IoT signal detection ent://SD_ILS/0/SD_ILS:599525 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Preferred Shelf Number&#160;TK5105.8857<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394183111">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394183111</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistics at square two : understanding modern statistical applications in medicine ent://SD_ILS/0/SD_ILS:598066 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Campbell, Michael J., 1950- author.&#160;Jacques, Richard M., author.<br/>Preferred Shelf Number&#160;RA409.5 .C36 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119401407">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119401407</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of archaeological sciences ent://SD_ILS/0/SD_ILS:597943 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Pollard, A. M., editor.&#160;Armitage, Ruth Ann, editor.&#160;Makarewicz, Cheryl, editor.<br/>Preferred Shelf Number&#160;CC75 .H36 2023 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119592112">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119592112</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> How to measure anything in cybersecurity risk ent://SD_ILS/0/SD_ILS:598301 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Hubbard, Douglas W., 1962- author.&#160;Seiersen, Richard, 1967- author.<br/>Preferred Shelf Number&#160;HV6773.15 .C97 H835 2023 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119892335">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119892335</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> M-statistics : optimal statistical inference for a small sample ent://SD_ILS/0/SD_ILS:598303 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Demidenko, Eugene, 1948- author.<br/>Preferred Shelf Number&#160;QA276 .A2 D46 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119891826">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119891826</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Symbolic approaches to modeling and analysis of biological systems ent://SD_ILS/0/SD_ILS:598490 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Lhoussaine, C&eacute;dric, editor.&#160;R&eacute;my, Elisabeth, editor.<br/>Preferred Shelf Number&#160;QH324.2 .S96 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229086">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229086</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Himalaya : Dynamics of a Giant, Current Activity of the Himalayan Range ent://SD_ILS/0/SD_ILS:598568 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Cattin, Rodolphe, editor.&#160;Epard, Jean-Luc, editor.<br/>Preferred Shelf Number&#160;DS485 .H6 .H563 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394228683">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394228683</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advanced techniques for maintenance modeling and reliability analysis of repairable systems ent://SD_ILS/0/SD_ILS:598651 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Sharma, Garima, author.&#160;Rai, Rajiv Nandan, author.<br/>Preferred Shelf Number&#160;TA169 .S53 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394174836">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394174836</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of intelligent computing and optimization for sustainable development ent://SD_ILS/0/SD_ILS:597426 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Manshahia, Mukhdeep Singh, editor.<br/>Preferred Shelf Number&#160;Q335<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119792642">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119792642</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reinforcement learning and stochastic optimization : a unified framework for sequential decisions ent://SD_ILS/0/SD_ILS:597441 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Powell, Warren B., 1955- author.<br/>Preferred Shelf Number&#160;Q325.6 .P69 2022<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119815068">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119815068</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated life testing of one-shot devices : data collection and analysis ent://SD_ILS/0/SD_ILS:596340 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Balakrishnan, N., 1956- author.&#160;Ling, Man Ho, author.&#160;So, Hon Yiu, author.<br/>Preferred Shelf Number&#160;TA169.3 .B35 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modern industrial statistics : with applications in R, MINITAB and JMP ent://SD_ILS/0/SD_ILS:596471 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Kenett, Ron, author.&#160;Zacks, Shelemyahu, 1932- author.&#160;Amberti, Daniele, author.<br/>Preferred Shelf Number&#160;TS156 .K46 2021<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Systems engineering in the fourth industrial revolution : big data, novel technologies, and modern systems engineering ent://SD_ILS/0/SD_ILS:595527 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Kenett, Ron, editor.&#160;Swarz, Robert S., editor.&#160;Zonnenshain, Avigdor, editor.<br/>Preferred Shelf Number&#160;TA168 .S8727 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513957">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119513957</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistics and the evaluation of evidence for forensic scientists ent://SD_ILS/0/SD_ILS:596045 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Aitken, C. G. G., author.&#160;Taroni, Franco, author.&#160;Bozza, Silvia, author.<br/>Preferred Shelf Number&#160;HV8073 .A38 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119245438">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119245438</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probability and statistical inference ent://SD_ILS/0/SD_ILS:596142 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Niewiadomska-Bugaj, Magdalena, author.&#160;Bartoszy&#324;ski, Robert, author.<br/>Preferred Shelf Number&#160;QA273<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119243830">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119243830</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Operational risk modeling in financial services : the exposure, occurrence, impact method ent://SD_ILS/0/SD_ILS:595044 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Na&iuml;m, Patrick, author.&#160;Condamin, Laurent, author.<br/>Preferred Shelf Number&#160;HG173 .N35 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119508557">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119508557</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of statistical genomics ent://SD_ILS/0/SD_ILS:595072 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Balding, D. J., editor.&#160;Moltke, Ida, editor.&#160;Marioni, John, editor.<br/>Preferred Shelf Number&#160;QH438.4 .S73 H36 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119487845">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119487845</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Model-based processing : an applied subspace identification approach ent://SD_ILS/0/SD_ILS:594848 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Candy, James V., author.<br/>Preferred Shelf Number&#160;TK5102.9 .C3195 2019<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119457695">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119457695</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical applications of Bayesian reliability ent://SD_ILS/0/SD_ILS:595173 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Liu, Yan, author.&#160;Abeyratne, Athula I., author.<br/>Preferred Shelf Number&#160;QA279.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Parametric time-frequency domain spatial audio ent://SD_ILS/0/SD_ILS:593781 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Pulkki, Ville, editor.&#160;Delikaris-Manias, Symeon, editor.&#160;Politis, Archontis, editor.<br/>Preferred Shelf Number&#160;TK7881.83 .P37 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119252634">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119252634</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Network meta-analysis for decision making ent://SD_ILS/0/SD_ILS:594035 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Dias, Sofia, 1977- author.<br/>Preferred Shelf Number&#160;R853 .M48<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118951651">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118951651</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Profit from your forecasting software : a best practice guide for sales forecasters ent://SD_ILS/0/SD_ILS:594378 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Goodwin, Paul, author.<br/>Preferred Shelf Number&#160;HF5438.4 .G66 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119415992">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119415992</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Analytic methods in systems and software testing ent://SD_ILS/0/SD_ILS:594482 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Kenett, Ron, editor.&#160;Ruggeri, Fabrizio, editor.&#160;Faltin, Frederick W., editor.<br/>Preferred Shelf Number&#160;QA76.76 .T48 A52 2018 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quantifying uncertainty in subsurface systems ent://SD_ILS/0/SD_ILS:594521 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Scheidt, Celine, author.&#160;Li, Lewis, author.&#160;Caers, Jef, author.<br/>Preferred Shelf Number&#160;QE33.2 .S82 S34 2018 EB<br/>Electronic Access&#160;<a href="https://agupubs.onlinelibrary.wiley.com/doi/book/10.1002/9781119325888">https://agupubs.onlinelibrary.wiley.com/doi/book/10.1002/9781119325888</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quantitative methods for health research : a practical interactive guide to epidemiology and statistics ent://SD_ILS/0/SD_ILS:593776 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Bruce, Nigel, 1955- author.&#160;Pope, Daniel, 1969- author.&#160;Stanistreet, Debbi, 1963- author.<br/>Preferred Shelf Number&#160;RA652.4 .B78 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118665374">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118665374</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Enhance oil &amp; gas exploration with data-driven geophysical and petrophysical models ent://SD_ILS/0/SD_ILS:593902 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Holdaway, Keith R., author.&#160;Irving, Duncan H. B., 1971- author.<br/>Preferred Shelf Number&#160;TN271 .P4 H653 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119394228">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119394228</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Wiley handbook of psychometric testing : a multidisciplinary reference on survey, scale and test development ent://SD_ILS/0/SD_ILS:594229 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Irwing, Paul, editor.<br/>Preferred Shelf Number&#160;BF39 .W55 2018<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118489772">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118489772</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Theory of probability : a critical introductory treatment ent://SD_ILS/0/SD_ILS:593136 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;De Finetti, Bruno, author.&#160;Mach&igrave;, Antonio, translator.&#160;Smith, Adrian F. M., translator.&#160;De Finetti, Bruno. Teoria delle probabilit&agrave;. English.<br/>Preferred Shelf Number&#160;QA273 .A5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119286387">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119286387</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Illuminating statistical analysis using scenarios and simulations ent://SD_ILS/0/SD_ILS:593375 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Kottemann, Jeffrey E.<br/>Preferred Shelf Number&#160;QA276 .K676 2017 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119296386">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119296386</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Introduction to Bayesian estimation and copula models of dependence ent://SD_ILS/0/SD_ILS:593462 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Shemyakin, Arkady.&#160;Kniazev, Alexander (Mathematician)<br/>Preferred Shelf Number&#160;QA279.5 .S435 2017 EB<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118959046">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118959046</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Big data and differential privacy : analysis strategies for railway track engineering ent://SD_ILS/0/SD_ILS:593464 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Attoh-Okine, Nii O., author.<br/>Preferred Shelf Number&#160;TF241 .A88 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119229070">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119229070</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment ent://SD_ILS/0/SD_ILS:593728 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Modarres, M. (Mohammad), author.&#160;Amiri, Mehdi, author.&#160;Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number&#160;TA169.5<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in chemical physics. Volume 162 ent://SD_ILS/0/SD_ILS:594171 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Rice, Stuart Alan, 1932-2024, editor.&#160;Dinner, Aaron R. (Aaron Reuven), editor.<br/>Preferred Shelf Number&#160;QD453.3<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119324560">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119324560</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Hybrid intelligence for image analysis and understanding ent://SD_ILS/0/SD_ILS:593734 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Bhattacharyya, Siddhartha, 1975- editor.&#160;Pan, Indrajit, 1983- editor.&#160;Mukherjee, Anirban, 1972- editor.&#160;Dutta, Paramartha, editor.<br/>Preferred Shelf Number&#160;TA1637 .H93 2017<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119242963">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119242963</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modern regression methods ent://SD_ILS/0/SD_ILS:593034 2026-01-21T23:21:46Z 2026-01-21T23:21:46Z Author&#160;Ryan, Thomas P., 1945-<br/>Preferred Shelf Number&#160;QA278.2 .R93 2009<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9780470382806">https://onlinelibrary.wiley.com/doi/book/10.1002/9780470382806</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>