Search Results for Bayesian Analysis. - Narrowed by: Failure analysis (Engineering)
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dBayesian$002bAnalysis.$0026qf$003dSUBJECT$002509Subject$002509Failure$002banalysis$002b$002528Engineering$002529$002509Failure$002banalysis$002b$002528Engineering$002529$0026te$003dILS$0026ps$003d300?
2026-01-24T05:02:28Z
Accelerated life testing of one-shot devices : data collection and analysis
ent://SD_ILS/0/SD_ILS:596340
2026-01-24T05:02:28Z
2026-01-24T05:02:28Z
Author Balakrishnan, N., 1956- author. Ling, Man Ho, author. So, Hon Yiu, author.<br/>Preferred Shelf Number TA169.3 .B35 2021<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
ent://SD_ILS/0/SD_ILS:593728
2026-01-24T05:02:28Z
2026-01-24T05:02:28Z
Author Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number TA169.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>