Search Results for Bie, Tijl.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dBie$00252C$002bTijl.$0026ps$003d300?dt=list2026-06-03T06:18:35ZAdvances in Intelligent Data Analysis XIV 14th International Symposium, IDA 2015, Saint Etienne. France, October 22 -24, 2015. Proceedingsent://SD_ILS/0/SD_ILS:5188992026-06-03T06:18:35Z2026-06-03T06:18:35ZAuthor Fromont, Elisa. editor. De Bie, Tijl. editor. van Leeuwen, Matthijs. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-24465-5">https://doi.org/10.1007/978-3-319-24465-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Machine Learning and Knowledge Discovery in Databases European Conference, ECML PKDD 2012, Bristol, UK, September 24-28, 2012. Proceedings, Part Ient://SD_ILS/0/SD_ILS:1973782026-06-03T06:18:35Z2026-06-03T06:18:35ZAuthor Flach, Peter A. editor. Bie, Tijl. editor. Cristianini, Nello. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33460-3">http://dx.doi.org/10.1007/978-3-642-33460-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Machine Learning and Knowledge Discovery in Databases European Conference, ECML PKDD 2012, Bristol, UK, September 24-28, 2012. Proceedings, Part IIent://SD_ILS/0/SD_ILS:1973852026-06-03T06:18:35Z2026-06-03T06:18:35ZAuthor Flach, Peter A. editor. Bie, Tijl. editor. Cristianini, Nello. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33486-3">http://dx.doi.org/10.1007/978-3-642-33486-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>