Search Results for Books. - Narrowed by: Reliability (Engineering) SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dBooks.$0026qf$003dSUBJECT$002509Subject$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ps$003d300? 2025-12-26T06:00:48Z Quality Assurance in Research and Development ent://SD_ILS/0/SD_ILS:541631 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Roberts, author.<br/>Preferred Shelf Number&#160;T175.5 R634 2014<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781498710473">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Guidelines for failure modes and effects analysis for medical devices ent://SD_ILS/0/SD_ILS:543242 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;PRESS, DYADEM.<br/>Preferred Shelf Number&#160;R856.6<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429205804">https://www.taylorfrancis.com/books/9780429205804</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Probabilistic design for optimization and robustness for engineers ent://SD_ILS/0/SD_ILS:341796 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Dodson, Bryan, 1962- author.&#160;Hammett, Patrick C., author.&#160;Klerx, Rene, author.<br/>Preferred Shelf Number&#160;ONLINE(341796.1)<br/>Electronic Access&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781118796306">Available by subscription from Safari Books Online</a> ebrary <a href="http://alltitles.ebrary.com/Doc?id=10896040">http://alltitles.ebrary.com/Doc?id=10896040</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118796245">http://dx.doi.org/10.1002/9781118796245</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118796306">http://proquest.tech.safaribooksonline.de/9781118796306</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamentals of reliability engineering : applications in multistage interconnection networks ent://SD_ILS/0/SD_ILS:342010 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Gunawan, Indra.<br/>Preferred Shelf Number&#160;ONLINE(342010.1)<br/>Electronic Access&#160;Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a> Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079">http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079</a> Ebook Library <a href="http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0">http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0</a> ebrary <a href="http://site.ebrary.com/id/10843879">http://site.ebrary.com/id/10843879</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Resilience engineering in practice. Volume 2, Becoming resilient ent://SD_ILS/0/SD_ILS:546515 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Nemeth, Christopher P., editor.&#160;Hollnagel, Erik, 1941- editor.<br/>Preferred Shelf Number&#160;TA169 .R4663 2014<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781315605708">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Guidelines for Laboratory Quality Auditing ent://SD_ILS/0/SD_ILS:539624 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Singer, author.<br/>Preferred Shelf Number&#160;R850 .S564 2014<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781498710527">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Risk analysis in engineering and economics ent://SD_ILS/0/SD_ILS:545726 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Ayyub, Bilal M., author.<br/>Preferred Shelf Number&#160;T174.5 .A99 2014<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781466518261">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Advanced risk analysis in engineering enterprise systems ent://SD_ILS/0/SD_ILS:538759 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Pinto, Cesar Ariel., author.&#160;Garvey, Paul R., 1956-<br/>Preferred Shelf Number&#160;TA169 .P56 2013<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439826157">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Systems engineering and safety : building the bridge ent://SD_ILS/0/SD_ILS:539717 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Glismann, Peter J., author.<br/>Preferred Shelf Number&#160;TA169 .G54 2013<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781466552135">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reinforced concrete structural reliability ent://SD_ILS/0/SD_ILS:543776 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;El-Reedy, Mohamed Abdallah., author.<br/>Preferred Shelf Number&#160;TA683 .E47 2013<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439874172">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Accelerated reliability and durability testing technology ent://SD_ILS/0/SD_ILS:297827 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Klyatis, Lev M.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a> ebrary <a href="http://site.ebrary.com/id/10592157">http://site.ebrary.com/id/10592157</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:249382 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Raheja, Dev.&#160;Gullo, Louis J.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Importance measures in reliability, risk, and optimization principles and applications ent://SD_ILS/0/SD_ILS:299386 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Kuo, Way, 1951-&#160;Zhu, Xiaoyan.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118314593">http://dx.doi.org/10.1002/9781118314593</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10559415">http://site.ebrary.com/lib/alltitles/Doc?id=10559415</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Infrastructure health in civil engineering ent://SD_ILS/0/SD_ILS:540938 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Ettouney, Mohammed, author.&#160;Alampalli, Sreenivas.<br/>Preferred Shelf Number&#160;TA656.6 .E88 2012<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420003758">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Infrastructure health in civil engineering ent://SD_ILS/0/SD_ILS:544764 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Ettouney, Mohammed., author.&#160;Alampalli, Sreenivas.<br/>Preferred Shelf Number&#160;TA656.6 .E88 2012<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439866542">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Maintaining Mission Critical Systems in a 24/7 Environment ent://SD_ILS/0/SD_ILS:249925 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Curtis, Peter M., author.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Multistate systems reliability theory with applications ent://SD_ILS/0/SD_ILS:298781 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Natvig, Bent, 1946-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10469650">http://site.ebrary.com/lib/alltitles/Doc?id=10469650</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design decisions under uncertainty with limited information ent://SD_ILS/0/SD_ILS:544270 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Nikolaidis, Efstratios, author.&#160;Mourelatos, Zissimos P.&#160;Pandey, Vijitashwa.<br/>Preferred Shelf Number&#160;TA174 .N55 2011<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781136853296">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Architecting resilient systems accident avoidance and survival and recovery from disruptions ent://SD_ILS/0/SD_ILS:297830 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Jackson, Scott.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470544013">http://dx.doi.org/10.1002/9780470544013</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10355233">http://site.ebrary.com/lib/alltitles/Doc?id=10355233</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability information and computer-based systems ent://SD_ILS/0/SD_ILS:249879 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Bauer, Eric.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Human reliability assessment : theory and practice ent://SD_ILS/0/SD_ILS:540046 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Spurgin, Anthony J., author.<br/>Preferred Shelf Number&#160;TA166 .S685 2010<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420068528">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Practical reliability engineering and analysis for system design and life-cycle sustainment ent://SD_ILS/0/SD_ILS:547196 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Wessels, William R., author.<br/>Preferred Shelf Number&#160;TS173 .W45 2010<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420094404">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Structural reliability ent://SD_ILS/0/SD_ILS:297978 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Lemaire, Maurice.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust design methodology for reliability exploring the effects of variation and uncertainty ent://SD_ILS/0/SD_ILS:298396 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Bergman, Bo, 1943-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical system reliability ent://SD_ILS/0/SD_ILS:153146 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Bauer, Eric.&#160;Zhang, Xuemei.&#160;Kimber, Douglas A.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability analysis and prediction with warranty data : issues, strategies, and methods ent://SD_ILS/0/SD_ILS:543197 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Rai, Bharatendra K., author.&#160;Singh, Nanua.<br/>Preferred Shelf Number&#160;K1032 .C6 R35 2009<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439803264">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Human reliability, error, and human factors in engineering maintenance : with reference to aviation and power generation ent://SD_ILS/0/SD_ILS:547574 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number&#160;TA167 .D468 2009<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781439803844">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability technology, human error, and quality in health care ent://SD_ILS/0/SD_ILS:542996 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number&#160;RA399 .A1 D487 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420065596">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Engineering design reliability applications : for the aerospace, automotive, and ship industries ent://SD_ILS/0/SD_ILS:539978 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Nikolaidis, Efstratios.&#160;Ghiocel, Dan M.&#160;Singhal, Suren.<br/>Preferred Shelf Number&#160;TA174 .E54 2008<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420051339">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Maintaining mission critical systems in a 24/7 environment ent://SD_ILS/0/SD_ILS:249485 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Curtis, Peter M.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Uncertainty modeling and analysis in engineering and the sciences ent://SD_ILS/0/SD_ILS:544184 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Ayyub, Bilal M., author.&#160;Klir, George J., 1932-<br/>Preferred Shelf Number&#160;TA330 .A995 2006<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420011456">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability, maintainability and risk practical methods for engineers ent://SD_ILS/0/SD_ILS:254854 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Smith, David John, 1943-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750666947">http://www.sciencedirect.com/science/book/9780750666947</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability, quality, and safety for engineers ent://SD_ILS/0/SD_ILS:547810 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number&#160;TS173 .D495 2005<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135484071">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> What every engineer should know about decision making under uncertainty ent://SD_ILS/0/SD_ILS:544345 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Wang, John X., 1962-&#160;CRC Press.<br/>Preferred Shelf Number&#160;TA190 .W36 2005<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429222733">https://www.taylorfrancis.com/books/9780429222733</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated testing and validation testing, engineering, and management tools for lean development ent://SD_ILS/0/SD_ILS:254184 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Porter, Alex.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design and analysis of accelerated tests for mission critical reliability ent://SD_ILS/0/SD_ILS:546254 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;LuValle, Michael J., author.&#160;Lefevre, Bruce G.&#160;Kannan, SriRaman.<br/>Preferred Shelf Number&#160;TA169.3 .L88 2004<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Practical engineering failure analysis ent://SD_ILS/0/SD_ILS:545309 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Tawancy, Hani M., author.&#160;Abbas, Nureddin Mohamed.&#160;Ul-Hamid, Anwar.<br/>Preferred Shelf Number&#160;TA169.5 .T39 2004<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135523695">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Guidelines for failure mode and effects analysis for automotive, aerospace and general manufacturing industries ent://SD_ILS/0/SD_ILS:540286 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Dyadem Press.<br/>Preferred Shelf Number&#160;TS156 .G795 2003<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135495480">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Risk analysis in engineering and economics ent://SD_ILS/0/SD_ILS:539259 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Ayyub, Bilal M., author.<br/>Preferred Shelf Number&#160;T174.5 .A98 2003<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135438999">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Mechanical reliability improvement : probability and statistics for experimental testing ent://SD_ILS/0/SD_ILS:541297 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Little, R. E. (Robert Eugene), 1933-&#160;Kosikowski, D. M.<br/>Preferred Shelf Number&#160;TA169 L778 2003<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429213335">https://www.taylorfrancis.com/books/9780429213335</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability verification, testing and analysis in engineering design ent://SD_ILS/0/SD_ILS:547339 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Wasserman, Gary S., 1951, author.<br/>Preferred Shelf Number&#160;TA169 .W37 2003<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135551483">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Design for reliability ent://SD_ILS/0/SD_ILS:543493 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Crow, Dana.&#160;Feinberg, Alec.<br/>Preferred Shelf Number&#160;TK7836 .D473 2001<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781315220192">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Reliability modeling, prediction, and optimization ent://SD_ILS/0/SD_ILS:300337 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Medical device reliability and associated areas ent://SD_ILS/0/SD_ILS:540912 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number&#160;R855.3 .D47 2000<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420042238">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Design reliability : fundamentals and applications ent://SD_ILS/0/SD_ILS:540572 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number&#160;TA174 .D4929 1999<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The design analysis handbook a practical guide to design validation ent://SD_ILS/0/SD_ILS:254797 2025-12-26T06:00:48Z 2025-12-26T06:00:48Z Author&#160;Walker, N. Edward.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750690881">http://www.sciencedirect.com/science/book/9780750690881</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>