Search Results for CMOS. - Narrowed by: 2009SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dCMOS.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092009$0025092009$0026ps$003d300?2024-11-09T00:59:34ZStructured Analog CMOS Designent://SD_ILS/0/SD_ILS:1702282024-11-09T00:59:34Z2024-11-09T00:59:34ZAuthor Stefanović, Danica. author. Kayal, Maher. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8573-4">http://dx.doi.org/10.1007/978-1-4020-8573-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Dynamic Offset Compensated CMOS Amplifiersent://SD_ILS/0/SD_ILS:2048792024-11-09T00:59:34Z2024-11-09T00:59:34ZAuthor Witte, Johan F. author. Makinwa, Kofi A. A. author. Huijsing, Johan H. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-2756-6">http://dx.doi.org/10.1007/978-90-481-2756-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transient-induced latchup in CMOS integrated circuitsent://SD_ILS/0/SD_ILS:2497852024-11-09T00:59:34Z2024-11-09T00:59:34ZAuthor Ker, Ming-Dou. Hsu, Sheng-Fu.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability wearout mechanisms in advanced CMOS technologiesent://SD_ILS/0/SD_ILS:2495742024-11-09T00:59:34Z2024-11-09T00:59:34ZAuthor Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Into the Nano Era Moore’s Law Beyond Planar Silicon CMOSent://SD_ILS/0/SD_ILS:1871932024-11-09T00:59:34Z2024-11-09T00:59:34ZAuthor Huff, Howard R. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74559-4">http://dx.doi.org/10.1007/978-3-540-74559-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>1V CMOS Gm-C Filters Design and Applicationsent://SD_ILS/0/SD_ILS:2047802024-11-09T00:59:34Z2024-11-09T00:59:34ZAuthor Lo, Tien-Yu. editor. Hung, Chung-Chih. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-2410-7">http://dx.doi.org/10.1007/978-90-481-2410-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Nano-CMOS design for manufacturability robust circuit and physical design for sub-65 nm technology nodesent://SD_ILS/0/SD_ILS:2973882024-11-09T00:59:34Z2024-11-09T00:59:34ZAuthor Wong, Ban P., 1953-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=413074">Click here to view book</a>
Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpNCMOSDM2">http://app.knovel.com/web/toc.v/cid:kpNCMOSDM2</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470382820">http://dx.doi.org/10.1002/9780470382820</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10278707">http://site.ebrary.com/lib/alltitles/Doc?id=10278707</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electronic device architectures for the nano-CMOS era from ultimate CMOS scaling to beyond CMOS devicesent://SD_ILS/0/SD_ILS:2862172024-11-09T00:59:34Z2024-11-09T00:59:34ZAuthor Deleonibus, Simon.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9789814241298">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Circuits at the nanoscale communications, imaging, and sensingent://SD_ILS/0/SD_ILS:2906012024-11-09T00:59:34Z2024-11-09T00:59:34ZAuthor Iniewski, Krzysztof.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420070637">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Defects in microelectronic materials and devicesent://SD_ILS/0/SD_ILS:2860102024-11-09T00:59:34Z2024-11-09T00:59:34ZAuthor Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420043778">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>