Search Results for Castillo, Enrique.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dCastillo$00252C$002bEnrique.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?dt=list2024-07-12T21:40:21ZA Unified Statistical Methodology for Modeling Fatigue Damageent://SD_ILS/0/SD_ILS:1704632024-07-12T21:40:21Z2024-07-12T21:40:21ZAuthor Castillo, Enrique. author. Fernández-Canteli, Alfonso. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-9182-7">http://dx.doi.org/10.1007/978-1-4020-9182-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Functional equations in applied sciencesent://SD_ILS/0/SD_ILS:2565212024-07-12T21:40:21Z2024-07-12T21:40:21ZAuthor Castillo, Enrique, 1946- Ruiz-Cobo, Maria Reyes, 1966- Iglesias, Andrés (Iglesias Prieto)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444517883">http://www.sciencedirect.com/science/book/9780444517883</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Building and solving mathematical programming models in engineering and scienceent://SD_ILS/0/SD_ILS:3002062024-07-12T21:40:21Z2024-07-12T21:40:21ZAuthor Castillo, Enrique, 1946- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780471225294">An electronic book accessible through the World Wide Web; click for information</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/2001026954.html">http://catdir.loc.gov/catdir/bios/wiley043/2001026954.html</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10509847">http://site.ebrary.com/lib/alltitles/Doc?id=10509847</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Orthogonal sets and polar methods in linear algebra applications to matrix calculations, systems of equations, inequalities, and linear programmingent://SD_ILS/0/SD_ILS:3002852024-07-12T21:40:21Z2024-07-12T21:40:21ZAuthor Castillo, Enrique, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118032893">http://dx.doi.org/10.1002/9781118032893</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/98038391.html">http://catdir.loc.gov/catdir/bios/wiley041/98038391.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Extreme value theory in engineeringent://SD_ILS/0/SD_ILS:2552392024-07-12T21:40:21Z2024-07-12T21:40:21ZAuthor Castillo, Enrique, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780121634759">http://www.sciencedirect.com/science/book/9780121634759</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Process Optimization A Statistical Approachent://SD_ILS/0/SD_ILS:1668382024-07-12T21:40:21Z2024-07-12T21:40:21ZAuthor Castillo, Enrique Del. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-71435-6">http://dx.doi.org/10.1007/978-0-387-71435-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Bayesian process monitoring, control and optimizationent://SD_ILS/0/SD_ILS:2865622024-07-12T21:40:21Z2024-07-12T21:40:21ZAuthor Colosimo, Bianca M. Del Castillo, Enrique.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420010701">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>From Vectors to Tensorsent://SD_ILS/0/SD_ILS:1811832024-07-12T21:40:21Z2024-07-12T21:40:21ZAuthor Ruíz-Tolosa, Juan Ramón. author. Castillo, Enrique. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138560">http://dx.doi.org/10.1007/b138560</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Run-to-run control in semiconductor manufacturingent://SD_ILS/0/SD_ILS:2867732024-07-12T21:40:21Z2024-07-12T21:40:21ZAuthor Moyne, James. Del Castillo, Enrique. Hurwitz, Arnon Max.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420040661">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Distribution Theory, Order Statistics, and Inferenceent://SD_ILS/0/SD_ILS:1681632024-07-12T21:40:21Z2024-07-12T21:40:21ZAuthor Balakrishnan, N. editor. Sarabia, José María. editor. Castillo, Enrique. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-8176-4487-3">http://dx.doi.org/10.1007/0-8176-4487-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Decomposition Techniques in Mathematical Programming Engineering and Science Applicationsent://SD_ILS/0/SD_ILS:1815372024-07-12T21:40:21Z2024-07-12T21:40:21ZAuthor Conejo, Antonio J. author. Castillo, Enrique. author. Mínguez, Roberto. author. García-Bertrand, Raquel. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-27686-6">http://dx.doi.org/10.1007/3-540-27686-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>