Search Results for Chakrabarty, Krishnendu. - Narrowed by: 2014 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dChakrabarty$00252C$002bKrishnendu.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092014$0025092014$0026ps$003d300?dt=list 2024-11-27T11:52:50Z Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs ent://SD_ILS/0/SD_ILS:487405 2024-11-27T11:52:50Z 2024-11-27T11:52:50Z Author&#160;Noia, Brandon. author.&#160;Chakrabarty, Krishnendu. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-02378-6">https://doi.org/10.1007/978-3-319-02378-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Testing for small-delay defects in nanoscale CMOS integrated circuits ent://SD_ILS/0/SD_ILS:342881 2024-11-27T11:52:50Z 2024-11-27T11:52:50Z Author&#160;Goel, Sandeep K, editor of compilation.&#160;Chakrabarty, Krishnendu, editor of compilation.<br/>Preferred Shelf Number&#160;ONLINE(342881.1)<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439829424">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>