Search Results for Chemistry. - Narrowed by: SpringerLink (Online service) - English - Electronic Library - Particles (Nuclear physics). - Weights and measures.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dChemistry.$0026qf$003dAUTHOR$002509Author$002509SpringerLink$002b$002528Online$002bservice$002529$002509SpringerLink$002b$002528Online$002bservice$002529$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Particles$002b$002528Nuclear$002bphysics$002529.$002509Particles$002b$002528Nuclear$002bphysics$002529.$0026qf$003dSUBJECT$002509Subject$002509Weights$002band$002bmeasures.$002509Weights$002band$002bmeasures.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?2024-09-07T18:39:20ZNeutrinos and Explosive Events in the Universeent://SD_ILS/0/SD_ILS:1689912024-09-07T18:39:20Z2024-09-07T18:39:20ZAuthor Shapiro, Maurice M. editor. Stanev, Todor. editor. Wefel, John P. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-3748-1">http://dx.doi.org/10.1007/1-4020-3748-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Surface and Interface Analysis An Electrochemists Toolboxent://SD_ILS/0/SD_ILS:1852662024-09-07T18:39:20Z2024-09-07T18:39:20ZAuthor Holze, Rudolf. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-49829-2">http://dx.doi.org/10.1007/978-3-540-49829-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Science of Microscopyent://SD_ILS/0/SD_ILS:1665002024-09-07T18:39:20Z2024-09-07T18:39:20ZAuthor Hawkes, Peter W. editor. Spence, John C. H. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Square-Wave Voltammetry Theory and Applicationent://SD_ILS/0/SD_ILS:1869492024-09-07T18:39:20Z2024-09-07T18:39:20ZAuthor Mirceski, Valentin. author. Komorsky-Lovric, Sebojka. author. Lovric, Milivoj. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-73740-7">http://dx.doi.org/10.1007/978-3-540-73740-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UKent://SD_ILS/0/SD_ILS:1829952024-09-07T18:39:20Z2024-09-07T18:39:20ZAuthor Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-31915-8">http://dx.doi.org/10.1007/3-540-31915-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>