Search Results for Chemistry. - Narrowed by: SpringerLink (Online service) - English - 2005 - Chemistry. - Microscopy.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dChemistry.$0026qf$003dAUTHOR$002509Author$002509SpringerLink$002b$002528Online$002bservice$002529$002509SpringerLink$002b$002528Online$002bservice$002529$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dPUBDATE$002509Publication$002bDate$0025092005$0025092005$0026qf$003dSUBJECT$002509Subject$002509Chemistry.$002509Chemistry.$0026qf$003dSUBJECT$002509Subject$002509Microscopy.$002509Microscopy.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?2024-09-07T14:49:03ZMicroscopy Techniques -/-ent://SD_ILS/0/SD_ILS:1827242024-09-07T14:49:03Z2024-09-07T14:49:03ZAuthor Rietdorf, Jens. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b14097">http://dx.doi.org/10.1007/b14097</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEMent://SD_ILS/0/SD_ILS:1652202024-09-07T14:49:03Z2024-09-07T14:49:03ZAuthor Egerton, Ray F. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Radiative Decay Engineeringent://SD_ILS/0/SD_ILS:1654142024-09-07T14:49:03Z2024-09-07T14:49:03ZAuthor Geddes, Chris D. editor. Lakowicz, Joseph R. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-27617-3">http://dx.doi.org/10.1007/0-387-27617-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>