Search Results for Chemistry. - Narrowed by: E-Book - English - Online Library - Microscopy. - Nanotechnology.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dChemistry.$0026qf$003dITYPE$002509Material$002bType$0025091$00253AE-KITAP$002509E-Book$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Microscopy.$002509Microscopy.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?2024-09-08T05:38:27ZScanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscaleent://SD_ILS/0/SD_ILS:1655342024-09-08T05:38:27Z2024-09-08T05:38:27ZAuthor Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currentsent://SD_ILS/0/SD_ILS:1661962024-09-08T05:38:27Z2024-09-08T05:38:27ZAuthor Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEMent://SD_ILS/0/SD_ILS:1652202024-09-08T05:38:27Z2024-09-08T05:38:27ZAuthor Egerton, Ray F. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>