Search Results for Chemistry. - Narrowed by: E-Book - English - 2005 - Weights and measures.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dChemistry.$0026qf$003dITYPE$002509Material$002bType$0025091$00253AE-KITAP$002509E-Book$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dPUBDATE$002509Publication$002bDate$0025092005$0025092005$0026qf$003dSUBJECT$002509Subject$002509Weights$002band$002bmeasures.$002509Weights$002band$002bmeasures.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?2024-07-25T23:36:17ZAdvanced Experimental Methods For Noise Research in Nanoscale Electronic Devicesent://SD_ILS/0/SD_ILS:1686652024-07-25T23:36:17Z2024-07-25T23:36:17ZAuthor Sikula, Josef. editor. Levinshtein, Michael. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-2170-4">http://dx.doi.org/10.1007/1-4020-2170-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Neutrinos and Explosive Events in the Universeent://SD_ILS/0/SD_ILS:1689912024-07-25T23:36:17Z2024-07-25T23:36:17ZAuthor Shapiro, Maurice M. editor. Stanev, Todor. editor. Wefel, John P. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-3748-1">http://dx.doi.org/10.1007/1-4020-3748-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Excimer Laser Technologyent://SD_ILS/0/SD_ILS:1808782024-07-25T23:36:17Z2024-07-25T23:36:17ZAuthor Basting, Dirk. editor. Marowsky, Gerd. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b137894">http://dx.doi.org/10.1007/b137894</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UKent://SD_ILS/0/SD_ILS:1829952024-07-25T23:36:17Z2024-07-25T23:36:17ZAuthor Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-31915-8">http://dx.doi.org/10.1007/3-540-31915-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Measurement Errors and Uncertainties Theory and Practiceent://SD_ILS/0/SD_ILS:1656022024-07-25T23:36:17Z2024-07-25T23:36:17ZAuthor Rabinovich, Semyon G. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-29143-1">http://dx.doi.org/10.1007/0-387-29143-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Integrated Chemical Microsensor Systems in CMOS Technologyent://SD_ILS/0/SD_ILS:1813722024-07-25T23:36:17Z2024-07-25T23:36:17ZAuthor Hierlemann, Andreas. author. Baltes, H. editor. Fujita, Hiroyuki. editor. Liepmann, Dorian. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138987">http://dx.doi.org/10.1007/b138987</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>