Search Results for Chemistry. - Narrowed by: E-Book - English - 2006 - Nanotechnology. - Particles (Nuclear physics).
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dChemistry.$0026qf$003dITYPE$002509Material$002bType$0025091$00253AE-KITAP$002509E-Book$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dPUBDATE$002509Publication$002bDate$0025092006$0025092006$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026qf$003dSUBJECT$002509Subject$002509Particles$002b$002528Nuclear$002bphysics$002529.$002509Particles$002b$002528Nuclear$002bphysics$002529.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?
2024-09-08T05:14:09Z
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
ent://SD_ILS/0/SD_ILS:166196
2024-09-08T05:14:09Z
2024-09-08T05:14:09Z
Author Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:181412
2024-09-08T05:14:09Z
2024-09-08T05:14:09Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nanoscale Transistors Device Physics, Modeling and Simulation
ent://SD_ILS/0/SD_ILS:165457
2024-09-08T05:14:09Z
2024-09-08T05:14:09Z
Author Lundstrom, Mark S. author. Guo, Jing. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-28003-0">http://dx.doi.org/10.1007/0-387-28003-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods III Characterization
ent://SD_ILS/0/SD_ILS:181079
2024-09-08T05:14:09Z
2024-09-08T05:14:09Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods IV Industrial Applications
ent://SD_ILS/0/SD_ILS:181082
2024-09-08T05:14:09Z
2024-09-08T05:14:09Z
Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>