Search Results for Chemistry. - Narrowed by: English - Online Library - Electronic Library - Chemistry. - Microscopy. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dChemistry.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Chemistry.$002509Chemistry.$0026qf$003dSUBJECT$002509Subject$002509Microscopy.$002509Microscopy.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue? 2024-09-07T18:24:19Z Pharmaceutical Microscopy ent://SD_ILS/0/SD_ILS:173165 2024-09-07T18:24:19Z 2024-09-07T18:24:19Z Author&#160;Carlton, Robert Allen. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-8831-7">http://dx.doi.org/10.1007/978-1-4419-8831-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Radiometry in Modern Scientific Experiments ent://SD_ILS/0/SD_ILS:197693 2024-09-07T18:24:19Z 2024-09-07T18:24:19Z Author&#160;Pravilov, A. M. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-7091-0104-9">http://dx.doi.org/10.1007/978-3-7091-0104-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> High Resolution Microbial Single Cell Analytics ent://SD_ILS/0/SD_ILS:193447 2024-09-07T18:24:19Z 2024-09-07T18:24:19Z Author&#160;M&uuml;ller, Susann. editor.&#160;Bley, Thomas. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-16887-1">http://dx.doi.org/10.1007/978-3-642-16887-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale ent://SD_ILS/0/SD_ILS:165534 2024-09-07T18:24:19Z 2024-09-07T18:24:19Z Author&#160;Kalinin, Sergei. editor.&#160;Gruverman, Alexei. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Science of Microscopy ent://SD_ILS/0/SD_ILS:166500 2024-09-07T18:24:19Z 2024-09-07T18:24:19Z Author&#160;Hawkes, Peter W. editor.&#160;Spence, John C. H. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents ent://SD_ILS/0/SD_ILS:166196 2024-09-07T18:24:19Z 2024-09-07T18:24:19Z Author&#160;Foster, Adam. author.&#160;Hofer, Werner. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Principles of Fluorescence Spectroscopy ent://SD_ILS/0/SD_ILS:166339 2024-09-07T18:24:19Z 2024-09-07T18:24:19Z Author&#160;Lakowicz, Joseph R. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-46312-4">http://dx.doi.org/10.1007/978-0-387-46312-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM ent://SD_ILS/0/SD_ILS:165220 2024-09-07T18:24:19Z 2024-09-07T18:24:19Z Author&#160;Egerton, Ray F. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Microscopy Techniques -/- ent://SD_ILS/0/SD_ILS:182724 2024-09-07T18:24:19Z 2024-09-07T18:24:19Z Author&#160;Rietdorf, Jens. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b14097">http://dx.doi.org/10.1007/b14097</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Radiative Decay Engineering ent://SD_ILS/0/SD_ILS:165414 2024-09-07T18:24:19Z 2024-09-07T18:24:19Z Author&#160;Geddes, Chris D. editor.&#160;Lakowicz, Joseph R. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-27617-3">http://dx.doi.org/10.1007/0-387-27617-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>