Search Results for Chemistry. - Narrowed by: English - Electronic Library - 2005 - Condensed matter. - Optical materials.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dChemistry.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026qf$003dPUBDATE$002509Publication$002bDate$0025092005$0025092005$0026qf$003dSUBJECT$002509Subject$002509Condensed$002bmatter.$002509Condensed$002bmatter.$0026qf$003dSUBJECT$002509Subject$002509Optical$002bmaterials.$002509Optical$002bmaterials.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?2024-09-07T18:49:11ZNanostructured and Advanced Materials for Applications in Sensor, Optoelectronic and Photovoltaic Technology Proceedings of the NATO Advanced Study Institute on Nanostructured and Advanced Materials for Applications in Sensors, Optoelectronic and Photovoltaic Technology Sozopol, Bulgaria 6–17 September 2004ent://SD_ILS/0/SD_ILS:1689312024-09-07T18:49:11Z2024-09-07T18:49:11ZAuthor Vaseashta, A. editor. Dimova-Malinovska, D. editor. Marshall, J. M. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-3562-4">http://dx.doi.org/10.1007/1-4020-3562-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quantum Dots: Fundamentals, Applications, and Frontiers Proceedings of the NATO Advanced Research Workshop on Quantum Dots: Fundamentals, Applications and Frontiers Crete, Greece, 20–24 July 2003ent://SD_ILS/0/SD_ILS:1688672024-09-07T18:49:11Z2024-09-07T18:49:11ZAuthor Joyce, Bruce A. editor. Kelires, Pantelis C. editor. Naumovets, Anton G. editor. Vvedensky, Dimitri D. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-3315-X">http://dx.doi.org/10.1007/1-4020-3315-X</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002ent://SD_ILS/0/SD_ILS:1687902024-09-07T18:49:11Z2024-09-07T18:49:11ZAuthor Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Thin Films and Heterostructures for Oxide Electronicsent://SD_ILS/0/SD_ILS:1652252024-09-07T18:49:11Z2024-09-07T18:49:11ZAuthor Ogale, Satischandra B. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b136780">http://dx.doi.org/10.1007/b136780</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Applied Physics of Carbon Nanotubes Fundamentals of Theory, Optics and Transport Devicesent://SD_ILS/0/SD_ILS:1816362024-09-07T18:49:11Z2024-09-07T18:49:11ZAuthor Rotkin, Slava V. editor. Subramoney, Shekhar. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-28075-8">http://dx.doi.org/10.1007/3-540-28075-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Silicon Quantum Integrated Circuits Silicon-Germanium Heterostructure Devices: Basics and Realisationsent://SD_ILS/0/SD_ILS:1806892024-09-07T18:49:11Z2024-09-07T18:49:11ZAuthor Kasper, Erich. author. Paul, D.J. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b137494">http://dx.doi.org/10.1007/b137494</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>High Dielectric Constant Materials VLSI MOSFET Applicationsent://SD_ILS/0/SD_ILS:1807482024-09-07T18:49:11Z2024-09-07T18:49:11ZAuthor Huff, H.R. editor. Gilmer, D.C. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b137574">http://dx.doi.org/10.1007/b137574</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Magnetic Microscopy of Nanostructuresent://SD_ILS/0/SD_ILS:1808642024-09-07T18:49:11Z2024-09-07T18:49:11ZAuthor Hopster, Herbert. editor. Oepen, Hans Peter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b137837">http://dx.doi.org/10.1007/b137837</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Graded Ferroelectrics, Transpacitors and Transponentsent://SD_ILS/0/SD_ILS:1648962024-09-07T18:49:11Z2024-09-07T18:49:11ZAuthor Mantese, Joseph V. author. Alpay, S. Pamir. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b101201">http://dx.doi.org/10.1007/b101201</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>