Search Results for Chemistry. - Narrowed by: English - 2005 - Condensed matter. - Optical materials. - Surfaces (Physics).SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dChemistry.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dPUBDATE$002509Publication$002bDate$0025092005$0025092005$0026qf$003dSUBJECT$002509Subject$002509Condensed$002bmatter.$002509Condensed$002bmatter.$0026qf$003dSUBJECT$002509Subject$002509Optical$002bmaterials.$002509Optical$002bmaterials.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?2024-09-07T17:53:05ZQuantum Dots: Fundamentals, Applications, and Frontiers Proceedings of the NATO Advanced Research Workshop on Quantum Dots: Fundamentals, Applications and Frontiers Crete, Greece, 20–24 July 2003ent://SD_ILS/0/SD_ILS:1688672024-09-07T17:53:05Z2024-09-07T17:53:05ZAuthor Joyce, Bruce A. editor. Kelires, Pantelis C. editor. Naumovets, Anton G. editor. Vvedensky, Dimitri D. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-3315-X">http://dx.doi.org/10.1007/1-4020-3315-X</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002ent://SD_ILS/0/SD_ILS:1687902024-09-07T17:53:05Z2024-09-07T17:53:05ZAuthor Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Thin Films and Heterostructures for Oxide Electronicsent://SD_ILS/0/SD_ILS:1652252024-09-07T17:53:05Z2024-09-07T17:53:05ZAuthor Ogale, Satischandra B. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b136780">http://dx.doi.org/10.1007/b136780</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>High Dielectric Constant Materials VLSI MOSFET Applicationsent://SD_ILS/0/SD_ILS:1807482024-09-07T17:53:05Z2024-09-07T17:53:05ZAuthor Huff, H.R. editor. Gilmer, D.C. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b137574">http://dx.doi.org/10.1007/b137574</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Graded Ferroelectrics, Transpacitors and Transponentsent://SD_ILS/0/SD_ILS:1648962024-09-07T17:53:05Z2024-09-07T17:53:05ZAuthor Mantese, Joseph V. author. Alpay, S. Pamir. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b101201">http://dx.doi.org/10.1007/b101201</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>