Search Results for Chemistry. - Narrowed by: English - 2007 - Particles (Nuclear physics). - Surfaces (Physics). SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dChemistry.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dPUBDATE$002509Publication$002bDate$0025092007$0025092007$0026qf$003dSUBJECT$002509Subject$002509Particles$002b$002528Nuclear$002bphysics$002529.$002509Particles$002b$002528Nuclear$002bphysics$002529.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue? 2024-07-26T05:51:09Z Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale ent://SD_ILS/0/SD_ILS:165534 2024-07-26T05:51:09Z 2024-07-26T05:51:09Z Author&#160;Kalinin, Sergei. editor.&#160;Gruverman, Alexei. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Science of Microscopy ent://SD_ILS/0/SD_ILS:166500 2024-07-26T05:51:09Z 2024-07-26T05:51:09Z Author&#160;Hawkes, Peter W. editor.&#160;Spence, John C. H. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamentals of Nanoscale Film Analysis ent://SD_ILS/0/SD_ILS:165623 2024-07-26T05:51:09Z 2024-07-26T05:51:09Z Author&#160;Alford, Terry L. author.&#160;Feldman, Leonard C. author.&#160;Mayer, James W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-29261-8">http://dx.doi.org/10.1007/978-0-387-29261-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:184523 2024-07-26T05:51:09Z 2024-07-26T05:51:09Z Author&#160;Bhushan, Bharat. editor.&#160;Kawata, Satoshi. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods VI Characterization ent://SD_ILS/0/SD_ILS:184524 2024-07-26T05:51:09Z 2024-07-26T05:51:09Z Author&#160;Bhushan, Bharat. editor.&#160;Kawata, Satoshi. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11776314">http://dx.doi.org/10.1007/11776314</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods VII Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:184525 2024-07-26T05:51:09Z 2024-07-26T05:51:09Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11785705">http://dx.doi.org/10.1007/11785705</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>