Search Results for Chemistry. - Narrowed by: English - Microscopy. - Surfaces (Physics).SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dChemistry.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dSUBJECT$002509Subject$002509Microscopy.$002509Microscopy.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?2024-09-07T21:01:58ZPharmaceutical Microscopyent://SD_ILS/0/SD_ILS:1731652024-09-07T21:01:58Z2024-09-07T21:01:58ZAuthor Carlton, Robert Allen. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-8831-7">http://dx.doi.org/10.1007/978-1-4419-8831-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Radiometry in Modern Scientific Experimentsent://SD_ILS/0/SD_ILS:1976932024-09-07T21:01:58Z2024-09-07T21:01:58ZAuthor Pravilov, A. M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-7091-0104-9">http://dx.doi.org/10.1007/978-3-7091-0104-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscaleent://SD_ILS/0/SD_ILS:1655342024-09-07T21:01:58Z2024-09-07T21:01:58ZAuthor Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Science of Microscopyent://SD_ILS/0/SD_ILS:1665002024-09-07T21:01:58Z2024-09-07T21:01:58ZAuthor Hawkes, Peter W. editor. Spence, John C. H. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currentsent://SD_ILS/0/SD_ILS:1661962024-09-07T21:01:58Z2024-09-07T21:01:58ZAuthor Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEMent://SD_ILS/0/SD_ILS:1652202024-09-07T21:01:58Z2024-09-07T21:01:58ZAuthor Egerton, Ray F. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>