Search Results for Chemistry. - Narrowed by: English - Particles (Nuclear physics). - Surfaces (Physics).
SirsiDynix Enterprise
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2024-07-25T19:59:29Z
Surface and Interface Analysis An Electrochemists Toolbox
ent://SD_ILS/0/SD_ILS:185266
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Author Holze, Rudolf. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-49829-2">http://dx.doi.org/10.1007/978-3-540-49829-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:188564
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Author Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:188568
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Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-85049-6">http://dx.doi.org/10.1007/978-3-540-85049-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transmission Electron Microscopy and Diffractometry of Materials
ent://SD_ILS/0/SD_ILS:186997
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Author Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:187050
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Author Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods IX Characterization
ent://SD_ILS/0/SD_ILS:187051
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Author Tomitori, Masahiko. editor. Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74083-4">http://dx.doi.org/10.1007/978-3-540-74083-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods X Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:187052
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Author Bhushan, Bharat. editor. Tomitori, Masahiko. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-74085-8">http://dx.doi.org/10.1007/978-3-540-74085-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
ent://SD_ILS/0/SD_ILS:165534
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Author Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Science of Microscopy
ent://SD_ILS/0/SD_ILS:166500
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Author Hawkes, Peter W. editor. Spence, John C. H. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamentals of Nanoscale Film Analysis
ent://SD_ILS/0/SD_ILS:165623
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Author Alford, Terry L. author. Feldman, Leonard C. author. Mayer, James W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-29261-8">http://dx.doi.org/10.1007/978-0-387-29261-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:184523
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Author Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods VI Characterization
ent://SD_ILS/0/SD_ILS:184524
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Author Bhushan, Bharat. editor. Kawata, Satoshi. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11776314">http://dx.doi.org/10.1007/11776314</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods VII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:184525
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Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11785705">http://dx.doi.org/10.1007/11785705</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Planewaves, Pseudopotentials and the LAPW Method
ent://SD_ILS/0/SD_ILS:165667
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Author Singh, David J. author. Nordström, Lars. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-29684-5">http://dx.doi.org/10.1007/978-0-387-29684-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
ent://SD_ILS/0/SD_ILS:166196
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Author Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Neutron and X-ray Spectroscopy
ent://SD_ILS/0/SD_ILS:168875
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Author Hippert, Françoise. editor. Geissler, Erik. editor. Hodeau, Jean Louis. editor. Lelièvre-Berna, Eddy. editor. Regnard, Jean-René. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-3337-0">http://dx.doi.org/10.1007/1-4020-3337-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Solid State NMR Spectroscopy for Biopolymers Principles and Applications
ent://SD_ILS/0/SD_ILS:169139
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Author Saitô, Hazime. author. Ando, Isao. author. Naito, Akira. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-4303-1">http://dx.doi.org/10.1007/1-4020-4303-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods III Characterization
ent://SD_ILS/0/SD_ILS:181079
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Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods IV Industrial Applications
ent://SD_ILS/0/SD_ILS:181082
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Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:181412
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Author Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of Practical X-Ray Fluorescence Analysis
ent://SD_ILS/0/SD_ILS:184419
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Author Beckhoff, Burkhard. editor. Kanngießer, habil. Birgit. editor. Langhoff, Norbert. editor. Wedell, Reiner. editor. Wolff, Helmut. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-36722-2">http://dx.doi.org/10.1007/978-3-540-36722-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Thin Films and Heterostructures for Oxide Electronics
ent://SD_ILS/0/SD_ILS:165225
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Author Ogale, Satischandra B. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b136780">http://dx.doi.org/10.1007/b136780</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>