Search Results for Circuits. - Narrowed by: Reliability.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dCircuits.$0026qf$003dSUBJECT$002509Subject$002509Reliability.$002509Reliability.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?2026-01-21T09:55:38ZBias Temperature Instability for Devices and Circuitsent://SD_ILS/0/SD_ILS:4847552026-01-21T09:55:38Z2026-01-21T09:55:38ZAuthor Grasser, Tibor. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-7909-3">https://doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VLSI Design and Test for Systems Dependabilityent://SD_ILS/0/SD_ILS:4837112026-01-21T09:55:38Z2026-01-21T09:55:38ZAuthor Asai, Shojiro. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability Physics and Engineering Time-To-Failure Modelingent://SD_ILS/0/SD_ILS:4829352026-01-21T09:55:38Z2026-01-21T09:55:38ZAuthor McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-93683-3">https://doi.org/10.1007/978-3-319-93683-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Electrical Contact of the Pantograph-Catenary System Theory and Applicationent://SD_ILS/0/SD_ILS:4834742026-01-21T09:55:38Z2026-01-21T09:55:38ZAuthor Wu, Guangning. author. Gao, Guoqiang. author. Wei, Wenfu. author. Yang, Zefeng. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-6589-8">https://doi.org/10.1007/978-981-13-6589-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodesent://SD_ILS/0/SD_ILS:4886422026-01-21T09:55:38Z2026-01-21T09:55:38ZAuthor Balasinski, Artur. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-1761-3">https://doi.org/10.1007/978-1-4614-1761-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Principles of Performance Engineering for Telecommunication and Information Systemsent://SD_ILS/0/SD_ILS:2479782026-01-21T09:55:38Z2026-01-21T09:55:38ZAuthor Ghanbari, M. Hughes, C. J. Sinclaire, M. C. Eade, J. P.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBTE035E">http://dx.doi.org/10.1049/PBTE035E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>