Search Results for Cluster - Narrowed by: Quality Control.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dCluster$0026qf$003dSUBJECT$002509Subject$002509Quality$002bControl.$002509Quality$002bControl.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?
2026-02-26T14:02:33Z
Reliability prediction for microelectronics
ent://SD_ILS/0/SD_ILS:598968
2026-02-26T14:02:33Z
2026-02-26T14:02:33Z
Author Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.<br/>Preferred Shelf Number TK7874<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Statistical quality control using Minitab, R, JMP, and Python
ent://SD_ILS/0/SD_ILS:596129
2026-02-26T14:02:33Z
2026-02-26T14:02:33Z
Author Gupta, Bhisham C., 1942- author.<br/>Preferred Shelf Number TS156 .Q3 G86 2021<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119671718">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119671718</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>