Search Results for Computer software -- Reliability. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dComputer$002bsoftware$002b--$002bReliability.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue? 2024-11-05T13:05:10Z Internet of Things, Smart Spaces, and Next Generation Networks and Systems 22nd International Conference, NEW2AN 2022, Tashkent, Uzbekistan, December 15-16, 2022, Proceedings ent://SD_ILS/0/SD_ILS:520839 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Koucheryavy, Yevgeni. editor. (orcid)&#160;Aziz, Ahmed. editor. (orcid)&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;XX(520839.1)<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-30258-9">https://doi.org/10.1007/978-3-031-30258-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer system reliability safety and usability ent://SD_ILS/0/SD_ILS:285390 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Dhillon, B. S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781466573130">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Secure and resilient software requirements, test cases, and testing methods ent://SD_ILS/0/SD_ILS:290799 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Merkow, Mark S.&#160;Raghavan, Lakshmikanth.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439866221">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability and availability of cloud computing ent://SD_ILS/0/SD_ILS:249383 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Bauer, Eric.&#160;Adams, Randee.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Model-Based Requirements Engineering ent://SD_ILS/0/SD_ILS:247874 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Holt, Jon&#160;Perry, Simon A&#160;Brownsword, Mike<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBPC009E">http://dx.doi.org/10.1049/PBPC009E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied software measurement global analysis of productivity and quality ent://SD_ILS/0/SD_ILS:293330 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Jones, Capers.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/applied-software-measurement">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Secure and resilient software development ent://SD_ILS/0/SD_ILS:290714 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Merkow, Mark S.&#160;Raghavan, Lakshmikanth.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439826973">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Systems and software engineering with applications ent://SD_ILS/0/SD_ILS:249813 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Schneidewind, Norman.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539</a> IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software error detection through testing and analysis ent://SD_ILS/0/SD_ILS:297725 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Huang, J. C., 1935-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470464076">http://dx.doi.org/10.1002/9780470464076</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=227967&ref=toc">http://www.myilibrary.com?id=227967&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10332960">http://site.ebrary.com/lib/alltitles/Doc?id=10332960</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=456102">http://swb.eblib.com/patron/FullRecord.aspx?p=456102</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Tutorial on hardware and software reliability, maintainability, and availability ent://SD_ILS/0/SD_ILS:249814 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Schneidewind, Norman.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540</a> IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Using aspect-oriented programming for trustworthy software development ent://SD_ILS/0/SD_ILS:297624 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Safonov, V. O. (Vladimir Olegovich)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=26061">http://www.books24x7.com/marc.asp?bookid=26061</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470283110">http://dx.doi.org/10.1002/9780470283110</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=138149&ref=toc">http://www.myilibrary.com?id=138149&ref=toc</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0829/2007041615-b.html">http://catdir.loc.gov/catdir/enhancements/fy0829/2007041615-b.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Trustworthy computing analytical and quantitative engineering evaluation ent://SD_ILS/0/SD_ILS:296957 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Sahinoglu, Mehmet, 1951-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0739/2006033567-b.html">http://catdir.loc.gov/catdir/enhancements/fy0739/2006033567-b.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470127872">http://dx.doi.org/10.1002/9780470127872</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Trustworthy systems through quantitative software engineering ent://SD_ILS/0/SD_ILS:249437 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Bernstein, Lawrence, 1940-&#160;Yuhas, C. M.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software safety and reliability : techniques, approaches, and standards of key industrial sectors ent://SD_ILS/0/SD_ILS:113008 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Herrmann, Debra S.<br/>Preferred Shelf Number&#160;QA76.76.R44 H39 1999<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> SafeWare : system safety and computers ent://SD_ILS/0/SD_ILS:88788 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Leveson, Nancy.<br/>Preferred Shelf Number&#160;QA 76.76.R44 L48 1995<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Ensuring software reliability ent://SD_ILS/0/SD_ILS:289793 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Neufelder, Ann Marie, 1960-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439832752">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer Control of Real-Time Processes ent://SD_ILS/0/SD_ILS:247698 2024-11-05T13:05:10Z 2024-11-05T13:05:10Z Author&#160;Bennett, S., ed.&#160;Virk, G. S., ed.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1049/PBCE041E">http://dx.doi.org/10.1049/PBCE041E</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>