Search Results for Computer software -- Testing - Narrowed by: 2024
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dComputer$002bsoftware$002b--$002bTesting$0026qf$003dPUBDATE$002509Publication$002bDate$0025092024$0025092024$0026ps$003d300?dt=list
2026-06-15T19:37:01Z
The French School of Programming
ent://SD_ILS/0/SD_ILS:603390
2026-06-15T19:37:01Z
2026-06-15T19:37:01Z
Author Meyer, Bertrand. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-34518-0">https://doi.org/10.1007/978-3-031-34518-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamentals of software testing
ent://SD_ILS/0/SD_ILS:599212
2026-06-15T19:37:01Z
2026-06-15T19:37:01Z
Author Homès, Bernard, author.<br/>Preferred Shelf Number QA76.76 .T48 F86 2024<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394298976">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394298976</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Information Security, Privacy and Digital Forensics Select Proceedings of the International Conference, ICISPD 2022
ent://SD_ILS/0/SD_ILS:601918
2026-06-15T19:37:01Z
2026-06-15T19:37:01Z
Author Patel, Sankita J. editor. Chaudhary, Naveen Kumar. editor. Gohil, Bhavesh N. editor. Iyengar, S. S. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-5091-1">https://doi.org/10.1007/978-981-99-5091-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Innovations in VLSI, Signal Processing and Computational Technologies Select Proceedings of the 2nd International Conference, WREC 2023
ent://SD_ILS/0/SD_ILS:602435
2026-06-15T19:37:01Z
2026-06-15T19:37:01Z
Author Mehta, Gayatri. editor. Wickramasinghe, Nilmini. editor. Kakkar, Deepti. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-7077-3">https://doi.org/10.1007/978-981-99-7077-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Embedded software system testing : automatic testing solution based on formal method
ent://SD_ILS/0/SD_ILS:575375
2026-06-15T19:37:01Z
2026-06-15T19:37:01Z
Author Yin, Yongfeng, 1978- author. Jiang, Bo, 1981- author. Su, Qingran, translator. Qiu, Ruinan, translator. Guo, Yang (Translator), translator.<br/>Preferred Shelf Number TK7895 .E42<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003390923">https://www.taylorfrancis.com/books/9781003390923</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>