Search Results for Computer software -- Testing - Narrowed by: Electronic books.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dComputer$002bsoftware$002b--$002bTesting$0026qf$003dSUBJECT$002509Subject$002509Electronic$002bbooks.$002509Electronic$002bbooks.$0026ic$003dtrue$0026ps$003d300?2026-01-21T01:57:44ZWireless communication signals : a laboratory-based approachent://SD_ILS/0/SD_ILS:5964312026-01-21T01:57:44Z2026-01-21T01:57:44ZAuthor Arslan, Hüseyin, 1968- author.<br/>Preferred Shelf Number TK5105 .A76 2021<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119764441">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119764441</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Electrical Engineering Handbook - Six Volume Setent://SD_ILS/0/SD_ILS:5424842026-01-21T01:57:44Z2026-01-21T01:57:44ZAuthor Dorf, Richard C., editor. Taylor and Francis.<br/>Preferred Shelf Number R857 .B54<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Analytic methods in systems and software testingent://SD_ILS/0/SD_ILS:5944822026-01-21T01:57:44Z2026-01-21T01:57:44ZAuthor Kenett, Ron, editor. Ruggeri, Fabrizio, editor. Faltin, Frederick W., editor.<br/>Preferred Shelf Number QA76.76 .T48 A52 2018 EB<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>How to Reduce the Cost of Software Testingent://SD_ILS/0/SD_ILS:5394452026-01-21T01:57:44Z2026-01-21T01:57:44ZAuthor Heusser, Matthew, editor. Kulkarni, Govind, editor. Taylor and Francis.<br/>Preferred Shelf Number QA76.76 .T48<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315169484">Click here to view</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer vision and imaging in intelligent transportation systemsent://SD_ILS/0/SD_ILS:5935612026-01-21T01:57:44Z2026-01-21T01:57:44ZAuthor Loce, Robert P., editor. Bala, Raja, editor. Trivedi, Mohan M., editor.<br/>Preferred Shelf Number TE228.3<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118971666">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118971666</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Hacking the hacker : learn from the experts who take down hackersent://SD_ILS/0/SD_ILS:5936362026-01-21T01:57:44Z2026-01-21T01:57:44ZAuthor Grimes, Roger A., author.<br/>Preferred Shelf Number QA76.9 .A25<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119396260">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119396260</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Software error detection through testing and analysisent://SD_ILS/0/SD_ILS:2977252026-01-21T01:57:44Z2026-01-21T01:57:44ZAuthor Huang, J. C., 1935-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456102</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470464076">http://dx.doi.org/10.1002/9780470464076</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=227967&ref=toc">http://www.myilibrary.com?id=227967&ref=toc</a>
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<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=456102">http://swb.eblib.com/patron/FullRecord.aspx?p=456102</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Software testing testing across the entire software development life cycleent://SD_ILS/0/SD_ILS:2495092026-01-21T01:57:44Z2026-01-21T01:57:44ZAuthor Everett, Gerald D., 1943- McLeod, Raymond. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5201507">http://ieeexplore.ieee.org/servlet/opac?bknumber=5201507</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computers, Software Engineering, and Digital Devicesent://SD_ILS/0/SD_ILS:5424932026-01-21T01:57:44Z2026-01-21T01:57:44ZAuthor Dorf, Richard C., author. Taylor and Francis.<br/>Preferred Shelf Number TK7885<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420037050">Click here to view.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Unit testing in Java how tests drive the codeent://SD_ILS/0/SD_ILS:2536582026-01-21T01:57:44Z2026-01-21T01:57:44ZAuthor Link, Johannes. Frlich, Peter.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Volltext <a href="http://www.sciencedirect.com/science/book/9781558608689">http://www.sciencedirect.com/science/book/9781558608689</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>