Search Results for Computer systems -- Reliability. - Narrowed by: Electronic books. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dComputer$002bsystems$002b--$002bReliability.$0026qf$003dSUBJECT$002509Subject$002509Electronic$002bbooks.$002509Electronic$002bbooks.$0026ps$003d300? 2025-12-13T22:21:55Z Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems ent://SD_ILS/0/SD_ILS:249351 2025-12-13T22:21:55Z 2025-12-13T22:21:55Z Author&#160;Bauer, Eric.&#160;Adams, Randee.&#160;Eustace, Dan.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability information and computer-based systems ent://SD_ILS/0/SD_ILS:249879 2025-12-13T22:21:55Z 2025-12-13T22:21:55Z Author&#160;Bauer, Eric.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems ent://SD_ILS/0/SD_ILS:249594 2025-12-13T22:21:55Z 2025-12-13T22:21:55Z Author&#160;Pukite, Jan, 1928-&#160;Pukite, Paul.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Electrical Engineering Handbook - Six Volume Set ent://SD_ILS/0/SD_ILS:542484 2025-12-13T22:21:55Z 2025-12-13T22:21:55Z Author&#160;Dorf, Richard C., editor.&#160;Taylor and Francis.<br/>Preferred Shelf Number&#160;R857 .B54<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dependability benchmarking for computer systems ent://SD_ILS/0/SD_ILS:249772 2025-12-13T22:21:55Z 2025-12-13T22:21:55Z Author&#160;Kanoun, Karama.&#160;Spainhower, Lisa.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computers, Software Engineering, and Digital Devices ent://SD_ILS/0/SD_ILS:542493 2025-12-13T22:21:55Z 2025-12-13T22:21:55Z Author&#160;Dorf, Richard C., author.&#160;Taylor and Francis.<br/>Preferred Shelf Number&#160;TK7885<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420037050">Click here to view.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>