Search Results for Computer systems -- Reliability. - Narrowed by: Electronic books. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dComputer$002bsystems$002b--$002bReliability.$0026qf$003dSUBJECT$002509Subject$002509Electronic$002bbooks.$002509Electronic$002bbooks.$0026ps$003d300? 2026-02-18T19:32:08Z Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems ent://SD_ILS/0/SD_ILS:249351 2026-02-18T19:32:08Z 2026-02-18T19:32:08Z Author&#160;Bauer, Eric.&#160;Adams, Randee.&#160;Eustace, Dan.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design for reliability information and computer-based systems ent://SD_ILS/0/SD_ILS:249879 2026-02-18T19:32:08Z 2026-02-18T19:32:08Z Author&#160;Bauer, Eric.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems ent://SD_ILS/0/SD_ILS:249594 2026-02-18T19:32:08Z 2026-02-18T19:32:08Z Author&#160;Pukite, Jan, 1928-&#160;Pukite, Paul.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Safeguarding satellite communications : issues, challenges, and solutions ent://SD_ILS/0/SD_ILS:600245 2026-02-18T19:32:08Z 2026-02-18T19:32:08Z Author&#160;An, Jianpin, author.<br/>Preferred Shelf Number&#160;TK5104 .A53 2026<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394304325">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394304325</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Communication networks in smart power grids ent://SD_ILS/0/SD_ILS:599871 2026-02-18T19:32:08Z 2026-02-18T19:32:08Z Author&#160;Zhou, Boyang, author.<br/>Preferred Shelf Number&#160;TK3105 .Z46 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394285129">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394285129</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design and manufacturing practices for performability engineering ent://SD_ILS/0/SD_ILS:600102 2026-02-18T19:32:08Z 2026-02-18T19:32:08Z Author&#160;Chaturvedi, Sanjay K., editor.&#160;Gargama, Heeralal, editor.&#160;Rai, Rajiv N., editor.<br/>Preferred Shelf Number&#160;TS171 .D47 2025<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394345731">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394345731</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Integrating metaheuristics in computer vision for real-world optimization problems ent://SD_ILS/0/SD_ILS:599305 2026-02-18T19:32:08Z 2026-02-18T19:32:08Z Preferred Shelf Number&#160;TA1637 .I58 2024<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394230952">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394230952</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computational intelligence in sustainable reliability engineering ent://SD_ILS/0/SD_ILS:598272 2026-02-18T19:32:08Z 2026-02-18T19:32:08Z Author&#160;Malik, S. C., editor.<br/>Preferred Shelf Number&#160;TA169 .C65 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamental Generation Systems : Computer Science and Artificial Consciousness, the Informational Field of Generation of the Universe, the Sixth Sense of Living Beings ent://SD_ILS/0/SD_ILS:598454 2026-02-18T19:32:08Z 2026-02-18T19:32:08Z Author&#160;Cardon, Alain, 1946- author.&#160;El Hami, Abdelkhalak, author.<br/>Preferred Shelf Number&#160;Q325 .C37 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394225811">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394225811</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> 75th anniversary of the transistor ent://SD_ILS/0/SD_ILS:598494 2026-02-18T19:32:08Z 2026-02-18T19:32:08Z Author&#160;Nathan, Arokia, 1957- editor.&#160;Saha, Samar K., editor.&#160;Todi, Ravi M., editor.<br/>Preferred Shelf Number&#160;TK7871.9<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fog computing : theory and practice ent://SD_ILS/0/SD_ILS:595723 2026-02-18T19:32:08Z 2026-02-18T19:32:08Z Author&#160;Zomaya, Albert Y., editor.&#160;Abbas, Assad, editor.&#160;Khan, Samee Ullah, editor.<br/>Preferred Shelf Number&#160;QA76.585 .F648 2020<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119551713">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119551713</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Electrical Engineering Handbook - Six Volume Set ent://SD_ILS/0/SD_ILS:542484 2026-02-18T19:32:08Z 2026-02-18T19:32:08Z Author&#160;Dorf, Richard C., editor.&#160;Taylor and Francis.<br/>Preferred Shelf Number&#160;R857 .B54<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Real-time embedded systems ent://SD_ILS/0/SD_ILS:593770 2026-02-18T19:32:08Z 2026-02-18T19:32:08Z Author&#160;Wang, Jiacun, 1963- author.<br/>Preferred Shelf Number&#160;TK7895 .E42<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dependability benchmarking for computer systems ent://SD_ILS/0/SD_ILS:249772 2026-02-18T19:32:08Z 2026-02-18T19:32:08Z Author&#160;Kanoun, Karama.&#160;Spainhower, Lisa.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computers, Software Engineering, and Digital Devices ent://SD_ILS/0/SD_ILS:542493 2026-02-18T19:32:08Z 2026-02-18T19:32:08Z Author&#160;Dorf, Richard C., author.&#160;Taylor and Francis.<br/>Preferred Shelf Number&#160;TK7885<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420037050">Click here to view.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>