Search Results for Contamination (Technology) - Narrowed by: Contamination (Technology) SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dContamination$002b$002528Technology$002529$0026qf$003dSUBJECT$002509Subject$002509Contamination$002b$002528Technology$002529$002509Contamination$002b$002528Technology$002529$0026pe$003dd$00253A$0026ps$003d300?dt=list 2024-12-30T23:37:23Z Introduction to contamination control and cleanroom technology ent://SD_ILS/0/SD_ILS:300669 2024-12-30T23:37:23Z 2024-12-30T23:37:23Z Author&#160;Ramstorp, Matts.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527613120">http://dx.doi.org/10.1002/9783527613120</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Contamination and ESD control in high technology manufacturing ent://SD_ILS/0/SD_ILS:249474 2024-12-30T23:37:23Z 2024-12-30T23:37:23Z Author&#160;Welker, R. W.&#160;Nagarajan, R. (Ramamurthy)&#160;Newberg, Carl E.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201423">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201423</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Formation testing : pressure transient and contamination analysis ent://SD_ILS/0/SD_ILS:341843 2024-12-30T23:37:23Z 2024-12-30T23:37:23Z Author&#160;Chin, Wilson C., author.<br/>Preferred Shelf Number&#160;ONLINE(341843.1)<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118831175">http://dx.doi.org/10.1002/9781118831175</a> <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118831175">http://onlinelibrary.wiley.com/book/10.1002/9781118831175</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63551">http://www.books24x7.com/marc.asp?bookid=63551</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Characterization of impurities and degradants using mass spectrometry ent://SD_ILS/0/SD_ILS:298682 2024-12-30T23:37:23Z 2024-12-30T23:37:23Z Author&#160;Pramanik, Birendra N., 1944-&#160;Lee, Mike S., 1960-&#160;Chen, Guodong.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470921371">An electronic book accessible through the World Wide Web; click for information</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=693190">Click here to view book</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy1114/2010023283-b.html">http://catdir.loc.gov/catdir/enhancements/fy1114/2010023283-b.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Isolation technology a practical guide ent://SD_ILS/0/SD_ILS:285777 2024-12-30T23:37:23Z 2024-12-30T23:37:23Z Author&#160;Coles, Tim P.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420025842">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Contamination control in practice ent://SD_ILS/0/SD_ILS:302259 2024-12-30T23:37:23Z 2024-12-30T23:37:23Z Author&#160;Ramstorp, Matts.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527612604">http://dx.doi.org/10.1002/9783527612604</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Contamination of electronic assemblies ent://SD_ILS/0/SD_ILS:110496 2024-12-30T23:37:23Z 2024-12-30T23:37:23Z Author&#160;Pecht, Michael.<br/>Preferred Shelf Number&#160;TK7870.15 C66 2003<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Identification and determination of impurities in drugs ent://SD_ILS/0/SD_ILS:254111 2024-12-30T23:37:23Z 2024-12-30T23:37:23Z Author&#160;G&ouml;r&ouml;g, S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444828996">http://www.sciencedirect.com/science/book/9780444828996</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Analytical artifacts GC, MS, HPLC, TLC, and PC ent://SD_ILS/0/SD_ILS:252934 2024-12-30T23:37:23Z 2024-12-30T23:37:23Z Author&#160;Middleditch, Brian S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444871589">http://www.sciencedirect.com/science/book/9780444871589</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>