Search Results for Contamination. - Narrowed by: Contamination (Technology)
SirsiDynix Enterprise
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Contamination control in practice
ent://SD_ILS/0/SD_ILS:302259
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Author Ramstorp, Matts. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527612604">http://dx.doi.org/10.1002/9783527612604</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Contamination of electronic assemblies
ent://SD_ILS/0/SD_ILS:110496
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Author Pecht, Michael.<br/>Preferred Shelf Number TK7870.15 C66 2003<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Formation testing : pressure transient and contamination analysis
ent://SD_ILS/0/SD_ILS:341843
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Author Chin, Wilson C., author.<br/>Preferred Shelf Number ONLINE(341843.1)<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118831175">http://dx.doi.org/10.1002/9781118831175</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9781118831175">http://onlinelibrary.wiley.com/book/10.1002/9781118831175</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63551">http://www.books24x7.com/marc.asp?bookid=63551</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Introduction to contamination control and cleanroom technology
ent://SD_ILS/0/SD_ILS:300669
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Author Ramstorp, Matts. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527613120">http://dx.doi.org/10.1002/9783527613120</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Formation testing. Volume 3, Supercharge, pressure testing, and contamination models
ent://SD_ILS/0/SD_ILS:595171
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Author Chin, Wilson C., author.<br/>Preferred Shelf Number TN871.18<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119284567">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119284567</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Contamination and ESD control in high technology manufacturing
ent://SD_ILS/0/SD_ILS:249474
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Author Welker, R. W. Nagarajan, R. (Ramamurthy) Newberg, Carl E. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201423">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201423</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Characterization of impurities and degradants using mass spectrometry
ent://SD_ILS/0/SD_ILS:298682
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Author Pramanik, Birendra N., 1944- Lee, Mike S., 1960- Chen, Guodong. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470921371">An electronic book accessible through the World Wide Web; click for information</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=693190">Click here to view book</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy1114/2010023283-b.html">http://catdir.loc.gov/catdir/enhancements/fy1114/2010023283-b.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Isolation technology : a practical guide
ent://SD_ILS/0/SD_ILS:540558
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Author Coles, Tim P.<br/>Preferred Shelf Number RS192 .C645 2004 EB<br/>Electronic Access Taylor & Francis <a href="http://www.taylorfrancis.com/books/9781420025842">http://www.taylorfrancis.com/books/9781420025842</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420025842">https://www.taylorfrancis.com/books/9781420025842</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367801182">https://www.taylorfrancis.com/books/9780367801182</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Identification and determination of impurities in drugs
ent://SD_ILS/0/SD_ILS:254111
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Author Görög, S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444828996">http://www.sciencedirect.com/science/book/9780444828996</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Analytical artifacts GC, MS, HPLC, TLC, and PC
ent://SD_ILS/0/SD_ILS:252934
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Author Middleditch, Brian S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444871589">http://www.sciencedirect.com/science/book/9780444871589</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>