Search Results for Data Analysis - Narrowed by: Reliability (Engineering)
SirsiDynix Enterprise
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Applied life data analysis
ent://SD_ILS/0/SD_ILS:300248
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Author Nelson, Wayne, 1936- John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0471725234">http://dx.doi.org/10.1002/0471725234</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability analysis and prediction with warranty data : issues, strategies, and methods
ent://SD_ILS/0/SD_ILS:543197
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Author Rai, Bharatendra K., author. Singh, Nanua.<br/>Preferred Shelf Number K1032 .C6 R35 2009<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439803264">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Design and manufacturing practices for performability engineering
ent://SD_ILS/0/SD_ILS:600102
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Author Chaturvedi, Sanjay K., editor. Gargama, Heeralal, editor. Rai, Rajiv N., editor.<br/>Preferred Shelf Number TS171 .D47 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394345731">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394345731</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability analysis of modern power systems
ent://SD_ILS/0/SD_ILS:599018
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Author Saket, R. K., editor. Sanjeevikumar, Padmanaban, 1978-<br/>Preferred Shelf Number TA169 .S234 2024<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computational intelligence in sustainable reliability engineering
ent://SD_ILS/0/SD_ILS:598272
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Author Malik, S. C., editor.<br/>Preferred Shelf Number TA169 .C65 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability analysis using MINITAB and Python
ent://SD_ILS/0/SD_ILS:597824
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Author Hwang, Jaejin, author.<br/>Preferred Shelf Number TA169 .H93 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Repairable systems reliability analysis : a comprehensive framework
ent://SD_ILS/0/SD_ILS:596328
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Author Rai, Rajiv Nandan, author. Chaturvedi, Sanjay K., author. Bolia, Nomesh, author.<br/>Preferred Shelf Number QA402 .R35 2020<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
ent://SD_ILS/0/SD_ILS:593728
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Author Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.<br/>Preferred Shelf Number TA169.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamentals of reliability engineering : applications in multistage interconnection networks
ent://SD_ILS/0/SD_ILS:342010
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Author Gunawan, Indra.<br/>Preferred Shelf Number ONLINE(342010.1)<br/>Electronic Access Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a>
Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079">http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079</a>
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ebrary <a href="http://site.ebrary.com/id/10843879">http://site.ebrary.com/id/10843879</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability engineering and risk analysis : a practical guide
ent://SD_ILS/0/SD_ILS:363877
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Author Modarres, M. (Mohammad) Kaminskiy, Mark, 1946- Krivtsov, Vasiliy, 1963-<br/>Preferred Shelf Number TA169 M627 2010<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Practical reliability engineering and analysis for system design and life-cycle sustainment
ent://SD_ILS/0/SD_ILS:547196
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Author Wessels, William R., author.<br/>Preferred Shelf Number TS173 .W45 2010<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420094404">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Human reliability assessment : theory and practice
ent://SD_ILS/0/SD_ILS:540046
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Author Spurgin, Anthony J., author.<br/>Preferred Shelf Number TA166 .S685 2010<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420068528">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Accelerated testing and validation testing, engineering, and management tools for lean development
ent://SD_ILS/0/SD_ILS:254184
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Author Porter, Alex.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design and analysis of accelerated tests for mission critical reliability
ent://SD_ILS/0/SD_ILS:546254
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Author LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.<br/>Preferred Shelf Number TA169.3 .L88 2004<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Risk analysis in engineering and economics
ent://SD_ILS/0/SD_ILS:539259
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Author Ayyub, Bilal M., author.<br/>Preferred Shelf Number T174.5 .A98 2003<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135438999">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Medical device reliability and associated areas
ent://SD_ILS/0/SD_ILS:540912
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Author Dhillon, B. S. (Balbir S.), 1947, author.<br/>Preferred Shelf Number R855.3 .D47 2000<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420042238">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Design reliability : fundamentals and applications
ent://SD_ILS/0/SD_ILS:540572
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Author Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number TA174 .D4929 1999<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>