Search Results for Davier, Alina A. von,
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dDavier$00252C$002bAlina$002bA.$002bvon$00252C$0026ps$003d300?dt=list
2026-06-01T15:16:19Z
Statistical models for test equating, scaling, and linking
ent://SD_ILS/0/SD_ILS:144646
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2026-06-01T15:16:19Z
Author Davier, Alina A. von.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=372637">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=372637</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The Kernel method of test equating
ent://SD_ILS/0/SD_ILS:144174
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2026-06-01T15:16:19Z
Author Davier, Alina A. von. Holland, Paul W. Thayer, Dorothy T.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Generalized kernel equating with applications in R
ent://SD_ILS/0/SD_ILS:589255
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2026-06-01T15:16:19Z
Author Wiberg, Marie, author. González, Jorge, author. Davier, Alina A. von, author.<br/>Preferred Shelf Number QA276<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781315283777">https://www.taylorfrancis.com/books/9781315283777</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Research for Practical Issues and Solutions in Computerized Multistage Testing
ent://SD_ILS/0/SD_ILS:576759
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Author Yan, Duanli, editor. Davier, Alina A. von, editor. Weiss, David J., editor.<br/>Preferred Shelf Number LB3051<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429263491">https://www.taylorfrancis.com/books/9780429263491</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computerized multistage testing : theory and applications
ent://SD_ILS/0/SD_ILS:539706
2026-06-01T15:16:19Z
2026-06-01T15:16:19Z
Author Yan, Duanli, editor. Davier, Alina A. von, editor. Lewis, Charles, editor.<br/>Preferred Shelf Number H62 .C66 2014<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781466505803">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>