Search Results for Debugging. - Narrowed by: 2023 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dDebugging.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092023$0025092023$0026ps$003d300? 2026-02-11T17:57:32Z Computer Science and Education 17th International Conference, ICCSE 2022, Ningbo, China, August 18-21, 2022, Revised Selected Papers, Part III ent://SD_ILS/0/SD_ILS:520246 2026-02-11T17:57:32Z 2026-02-11T17:57:32Z Author&#160;Hong, Wenxing. editor.&#160;Weng, Yang. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-99-2449-3">https://doi.org/10.1007/978-981-99-2449-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Analysis, Verification and Transformation for Declarative Programming and Intelligent Systems Essays Dedicated to Manuel Hermenegildo on the Occasion of His 60th Birthday ent://SD_ILS/0/SD_ILS:520864 2026-02-11T17:57:32Z 2026-02-11T17:57:32Z Author&#160;Lopez-Garcia, Pedro. editor.&#160;Gallagher, John P. editor.&#160;Giacobazzi, Roberto. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-31476-6">https://doi.org/10.1007/978-3-031-31476-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ethics in Artificial Intelligence: Bias, Fairness and Beyond ent://SD_ILS/0/SD_ILS:529041 2026-02-11T17:57:32Z 2026-02-11T17:57:32Z Author&#160;Mukherjee, Animesh. editor.&#160;Kulshrestha, Juhi. editor.&#160;Chakraborty, Abhijnan. editor.&#160;Kumar, Srijan. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-99-7184-8">https://doi.org/10.1007/978-981-99-7184-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Beginning software engineering ent://SD_ILS/0/SD_ILS:599078 2026-02-11T17:57:32Z 2026-02-11T17:57:32Z Author&#160;Stephens, Rod, author.<br/>Preferred Shelf Number&#160;QA76.758 .S74 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394320592">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394320592</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advances in Quantitative Ethnography 5th International Conference, ICQE 2023, Melbourne, VIC, Australia, October 8-12, 2023, Proceedings ent://SD_ILS/0/SD_ILS:520715 2026-02-11T17:57:32Z 2026-02-11T17:57:32Z Author&#160;Arastoopour Irgens, Golnaz. editor.&#160;Knight, Simon. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-47014-1">https://doi.org/10.1007/978-3-031-47014-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applicable Formal Methods for Safe Industrial Products Essays Dedicated to Jan Peleska on the Occasion of His 65th Birthday ent://SD_ILS/0/SD_ILS:521073 2026-02-11T17:57:32Z 2026-02-11T17:57:32Z Author&#160;Haxthausen, Anne E. editor.&#160;Huang, Wen-ling. editor.&#160;Roggenbach, Markus. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-40132-9">https://doi.org/10.1007/978-3-031-40132-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Formal Verification of Structurally Complex Multipliers ent://SD_ILS/0/SD_ILS:527041 2026-02-11T17:57:32Z 2026-02-11T17:57:32Z Author&#160;Mahzoon, Alireza. author.&#160;Gro&szlig;e, Daniel. author.&#160;Drechsler, Rolf. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-24571-8">https://doi.org/10.1007/978-3-031-24571-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of software fault localization : foundations and advances ent://SD_ILS/0/SD_ILS:597865 2026-02-11T17:57:32Z 2026-02-11T17:57:32Z Author&#160;Wong, W. Eric, editor.&#160;Tse, T. H., editor.&#160;John Wiley &amp; Sons, publisher.<br/>Preferred Shelf Number&#160;QA76.76 .F34 H36 2023<br/>Electronic Access&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119880929">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119880929</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>