Search Results for Del Castillo, Enrique. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dDel$002bCastillo$00252C$002bEnrique.$0026ic$003dtrue$0026ps$003d300? 2024-10-31T00:39:52Z Process Optimization A Statistical Approach ent://SD_ILS/0/SD_ILS:166838 2024-10-31T00:39:52Z 2024-10-31T00:39:52Z Author&#160;Castillo, Enrique Del. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-71435-6">http://dx.doi.org/10.1007/978-0-387-71435-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bayesian process monitoring, control and optimization ent://SD_ILS/0/SD_ILS:286562 2024-10-31T00:39:52Z 2024-10-31T00:39:52Z Author&#160;Colosimo, Bianca M.&#160;Del Castillo, Enrique.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420010701">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Run-to-run control in semiconductor manufacturing ent://SD_ILS/0/SD_ILS:286773 2024-10-31T00:39:52Z 2024-10-31T00:39:52Z Author&#160;Moyne, James.&#160;Del Castillo, Enrique.&#160;Hurwitz, Arnon Max.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420040661">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>