Search Results for Del Castillo, Enrique.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dDel$002bCastillo$00252C$002bEnrique.$0026ic$003dtrue$0026ps$003d300?2024-10-31T00:39:52ZProcess Optimization A Statistical Approachent://SD_ILS/0/SD_ILS:1668382024-10-31T00:39:52Z2024-10-31T00:39:52ZAuthor Castillo, Enrique Del. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-71435-6">http://dx.doi.org/10.1007/978-0-387-71435-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Bayesian process monitoring, control and optimizationent://SD_ILS/0/SD_ILS:2865622024-10-31T00:39:52Z2024-10-31T00:39:52ZAuthor Colosimo, Bianca M. Del Castillo, Enrique.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420010701">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Run-to-run control in semiconductor manufacturingent://SD_ILS/0/SD_ILS:2867732024-10-31T00:39:52Z2024-10-31T00:39:52ZAuthor Moyne, James. Del Castillo, Enrique. Hurwitz, Arnon Max.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420040661">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>