Search Results for Detectors. - Narrowed by: 2007 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dDetectors.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092007$0025092007$0026ps$003d300?dt=list 2024-10-22T09:19:08Z Semiconductor Radiation Detectors Device Physics ent://SD_ILS/0/SD_ILS:186341 2024-10-22T09:19:08Z 2024-10-22T09:19:08Z Author&#160;Lutz, Gerhard. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-71679-2">http://dx.doi.org/10.1007/978-3-540-71679-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Physics for Medical Imaging Applications ent://SD_ILS/0/SD_ILS:169553 2024-10-22T09:19:08Z 2024-10-22T09:19:08Z Author&#160;Lemoigne, Yves. editor.&#160;Caner, Alessandra. editor.&#160;Rahal, Ghita. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-5653-6">http://dx.doi.org/10.1007/978-1-4020-5653-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Sensors applications ent://SD_ILS/0/SD_ILS:303573 2024-10-22T09:19:08Z 2024-10-22T09:19:08Z Author&#160;Hesse, J.&#160;Gardner, J. 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(Julian W.), 1958-&#160;G&ouml;pel, W.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527619252">http://dx.doi.org/10.1002/9783527619252</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Intelligent sensor design using the microchip dsPIC ent://SD_ILS/0/SD_ILS:145644 2024-10-22T09:19:08Z 2024-10-22T09:19:08Z Author&#160;Huddleston, Creed.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Volltext <a href="http://www.sciencedirect.com/science/book/9780750677554">http://www.sciencedirect.com/science/book/9780750677554</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optical inspection of microsystems ent://SD_ILS/0/SD_ILS:287557 2024-10-22T09:19:08Z 2024-10-22T09:19:08Z Author&#160;Osten, Wolfgang.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420019162">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Modern sensors handbook ent://SD_ILS/0/SD_ILS:297593 2024-10-22T09:19:08Z 2024-10-22T09:19:08Z Author&#160;Ripka, Pavel.&#160;Tipek, Alois.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0743/2007003344-b.html">http://catdir.loc.gov/catdir/enhancements/fy0743/2007003344-b.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470612231">http://dx.doi.org/10.1002/9780470612231</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Trace chemical sensing of explosives ent://SD_ILS/0/SD_ILS:296870 2024-10-22T09:19:08Z 2024-10-22T09:19:08Z Author&#160;Woodfin, Ronald L.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470085207">http://dx.doi.org/10.1002/0470085207</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=82194&ref=toc">http://www.myilibrary.com?id=82194&ref=toc</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Biomedical optics principles and imaging ent://SD_ILS/0/SD_ILS:297042 2024-10-22T09:19:08Z 2024-10-22T09:19:08Z Author&#160;Wang, Lihong V.&#160;Wu, Hsin-i.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=708278">Click here to view book</a> ebrary <a href="http://oclc-marc.ebrary.com/Doc?id=10608195">An electronic book accessible through the World Wide Web; click to view</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470177013">http://dx.doi.org/10.1002/9780470177013</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0740/2006030754-b.html">http://catdir.loc.gov/catdir/enhancements/fy0740/2006030754-b.html</a> ebrary <a href="http://site.ebrary.com/id/10608195">http://site.ebrary.com/id/10608195</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamentals of instrumentation and measurement ent://SD_ILS/0/SD_ILS:297577 2024-10-22T09:19:08Z 2024-10-22T09:19:08Z Author&#160;Placko, Dominique.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0668/2006020964-b.html">http://catdir.loc.gov/catdir/enhancements/fy0668/2006020964-b.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470612026">http://dx.doi.org/10.1002/9780470612026</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>