Search Results for Diffraction patterns.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dDiffraction$002bpatterns.$0026ps$003d300?2024-10-26T23:32:42ZInterpretation of electron diffraction patternsent://SD_ILS/0/SD_ILS:721942024-10-26T23:32:42Z2024-10-26T23:32:42ZAuthor Andrews, Kenneth William. Dyson, David John, ort. yaz. Keown, Samuel Robert, ort. yaz.<br/>Preferred Shelf Number QD 921 A66 1971<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Interpretation of x-ray powder diffraction patternsent://SD_ILS/0/SD_ILS:328812024-10-26T23:32:42Z2024-10-26T23:32:42ZAuthor Lipson, Henry Solomon, 1910- Steeple, H.<br/>Preferred Shelf Number QD 945 L52 1970<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Self-similarity in Walsh Functions and in the Farfield Diffraction Patterns of Radial Walsh Filtersent://SD_ILS/0/SD_ILS:4023592024-10-26T23:32:42Z2024-10-26T23:32:42ZAuthor Hazra, Lakshminarayan. author. Mukherjee, Pubali. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-10-2809-0">https://doi.org/10.1007/978-981-10-2809-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Grafen ve Alkali Metal Katkılanmış Grafenin Elektron Kırınım Desenlerinin Deeklab Benzetim Yazılımı İle Analizi = Analysis of the Graphane and Alkali Metal Intercalated Graphane Electron Diffraction Patterns with Leedlab Simulation Softwareent://SD_ILS/0/SD_ILS:1398912024-10-26T23:32:42Z2024-10-26T23:32:42ZAuthor Sencer, Lerzan.<br/>Preferred Shelf Number TEZ 10142 .S46 2011<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Fringe pattern analysis for optical metrology : theory, algorithms, and applicationsent://SD_ILS/0/SD_ILS:3422252024-10-26T23:32:42Z2024-10-26T23:32:42ZAuthor Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.<br/>Preferred Shelf Number ONLINE(342225.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414">http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9783527681075">http://dx.doi.org/10.1002/9783527681075</a>
MyiLibrary <a href="http://www.myilibrary.com?id=615339">http://www.myilibrary.com?id=615339</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computational modelling of objects represented in images fundamentals, methods and applications III : proceedings of the International Symposium Compimage 2012, Rome, Italy, 5-7 September 2012ent://SD_ILS/0/SD_ILS:2854472024-10-26T23:32:42Z2024-10-26T23:32:42ZAuthor CompIMAGE 2012 (2012 : Rome, Italy) Di Giamberardino, Paolo.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203075371">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Interferogram analysis for optical testingent://SD_ILS/0/SD_ILS:2885012024-10-26T23:32:42Z2024-10-26T23:32:42ZAuthor Malacara, Daniel, 1937- Servn̕, Manuel. Malacara, Zacarias, 1948-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420027273">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>