Search Results for Diffraction. - Narrowed by: 2006SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dDiffraction.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092006$0025092006$0026ps$003d300?dt=list2026-01-16T01:28:07ZX-ray crystallography : an introduction to the investigation of crystals by their diffraction of monochromatic X-radiationent://SD_ILS/0/SD_ILS:328712026-01-16T01:28:07Z2026-01-16T01:28:07ZAuthor Buerger, Martin Julian, 1903-<br/>Preferred Shelf Number QD 945 B8624 1942<br/>Format: Books<br/>Availability Beytepe Library~2<br/>Powder Diffraction The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Dataent://SD_ILS/0/SD_ILS:1816162026-01-16T01:28:07Z2026-01-16T01:28:07ZAuthor Will, Georg. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-27986-5">http://dx.doi.org/10.1007/3-540-27986-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>X-Işını kırınımı yöntemiyle kripta-fosfazen türevlerinin kristal yapı analizi = Crystal structure analysis of crypta-phosphazane derivatives by X-Ray diffraction methodent://SD_ILS/0/SD_ILS:1048932026-01-16T01:28:07Z2026-01-16T01:28:07ZAuthor Tercan, Mustafa Barış.<br/>Preferred Shelf Number TEZ/7635 .T315 2006<br/>Format: Books<br/>Availability Beytepe Library~1<br/>X-ışını kırınımı yöntemi ile spiro,ansa,bino Ve spiro-ansa fosfazen ligandlarının kristal yapı analizleri = Crystal structure analysis of spiro,ansa,bino And spiro-ansa phosphazene ligands by X-Ray diffraction methodent://SD_ILS/0/SD_ILS:1052242026-01-16T01:28:07Z2026-01-16T01:28:07ZAuthor Çaylak, Nagihan.<br/>Preferred Shelf Number TEZ/7816 .C385 2006<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Acta crystallographica. Section A, foundations of crystallography.ent://SD_ILS/0/SD_ILS:2262312026-01-16T01:28:07Z2026-01-16T01:28:07ZAuthor International Union of Crystallography.<br/>Preferred Shelf Number ALFABETİK V.23A 1967<br/>Electronic Access <a href="http://onlinelibrary.wiley.com/journal/10.1111/(ISSN)1600-5724">Elektronik eri?im</a><br/>Format: Continuing Resources Other<br/>Availability Beytepe Library~23 ~0<br/>Electromagnetic wavesent://SD_ILS/0/SD_ILS:5415102026-01-16T01:28:07Z2026-01-16T01:28:07ZAuthor Someda, Carlo G., author.<br/>Preferred Shelf Number QC661 .S66 2006<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420009545">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>X-ray metrology in semiconductor manufacturingent://SD_ILS/0/SD_ILS:5435112026-01-16T01:28:07Z2026-01-16T01:28:07ZAuthor Bowen, D. Keith (David Keith), 1940- author. Tanner, B. K. (Brian Keith)<br/>Preferred Shelf Number TK7874.58 .B69 2006<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420005653">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Analytical characterization of aluminum, steel, and superalloysent://SD_ILS/0/SD_ILS:5389572026-01-16T01:28:07Z2026-01-16T01:28:07ZAuthor MacKenzie, D. Scott. Totten, George E.<br/>Preferred Shelf Number TA480 .A6 A65 2006<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420030365">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>