Search Results for Digital integrated circuits -- Testing.
SirsiDynix Enterprise
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Digital design and fabrication
ent://SD_ILS/0/SD_ILS:540504
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Author Oklobdzija, Vojin G.<br/>Preferred Shelf Number TK7885 .D54 2008<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315222226">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Digital integrated circuits : design-for-test using Simulink and Stateflow
ent://SD_ILS/0/SD_ILS:109724
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Author Perelroyzen, Evgeni.<br/>Preferred Shelf Number TK7874 .P445 2007<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
The VLSI handbook
ent://SD_ILS/0/SD_ILS:547504
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Author Chen, Wai-Kai, 1936-<br/>Preferred Shelf Number TK7874.75 .V573 2007<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420005967">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Microelectronics
ent://SD_ILS/0/SD_ILS:547489
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Author Whitaker, Jerry C.<br/>Preferred Shelf Number TK7874 .M4587 2006<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420037593">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
The Computer Engineering Handbook.
ent://SD_ILS/0/SD_ILS:543838
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Author Oklobdzija, Vojin G., author. CRC Press LLC.<br/>Preferred Shelf Number TK7885 .C645 2002<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420041545">https://www.taylorfrancis.com/books/9781420041545</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
ent://SD_ILS/0/SD_ILS:392732
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Author Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-<br/>Preferred Shelf Number TK7874.75 B87 2000<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Digital circuit testing a guide to DFT and other techniques
ent://SD_ILS/0/SD_ILS:255234
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Author Wang, Francis C.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127345802">http://www.sciencedirect.com/science/book/9780127345802</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Digital systems testing and testable design
ent://SD_ILS/0/SD_ILS:249585
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Author Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>