Search Results for Digital integrated circuits -- Testing. - Narrowed by: Online Library SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dDigital$002bintegrated$002bcircuits$002b--$002bTesting.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ps$003d300? 2024-11-05T11:14:09Z The VLSI handbook ent://SD_ILS/0/SD_ILS:289331 2024-11-05T11:14:09Z 2024-11-05T11:14:09Z Author&#160;Chen, Wai-Kai, 1936-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420005967">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Digital circuit testing a guide to DFT and other techniques ent://SD_ILS/0/SD_ILS:255234 2024-11-05T11:14:09Z 2024-11-05T11:14:09Z Author&#160;Wang, Francis C.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127345802">http://www.sciencedirect.com/science/book/9780127345802</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Digital systems testing and testable design ent://SD_ILS/0/SD_ILS:249585 2024-11-05T11:14:09Z 2024-11-05T11:14:09Z Author&#160;Abramovici, Miron.&#160;Breuer, Melvin A.&#160;Friedman, Arthur D.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>