Search Results for Digital integrated circuits -- Testing. - Narrowed by: Online LibrarySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dDigital$002bintegrated$002bcircuits$002b--$002bTesting.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ic$003dtrue$0026ps$003d300?2024-09-12T12:05:00ZThe VLSI handbookent://SD_ILS/0/SD_ILS:2893312024-09-12T12:05:00Z2024-09-12T12:05:00ZAuthor Chen, Wai-Kai, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420005967">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Digital circuit testing a guide to DFT and other techniquesent://SD_ILS/0/SD_ILS:2552342024-09-12T12:05:00Z2024-09-12T12:05:00ZAuthor Wang, Francis C.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127345802">http://www.sciencedirect.com/science/book/9780127345802</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Digital systems testing and testable designent://SD_ILS/0/SD_ILS:2495852024-09-12T12:05:00Z2024-09-12T12:05:00ZAuthor Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>