Search Results for Distribution (Probability theory) - Narrowed by: E-Book - Statistics. - System safety.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dDistribution$002b$002528Probability$002btheory$002529$0026qf$003dITYPE$002509Material$002bType$0025091$00253AE-KITAP$002509E-Book$0026qf$003dSUBJECT$002509Subject$002509Statistics.$002509Statistics.$0026qf$003dSUBJECT$002509Subject$002509System$002bsafety.$002509System$002bsafety.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?2024-09-06T22:07:18ZMathematical and Statistical Models and Methods in Reliability Applications to Medicine, Finance, and Quality Controlent://SD_ILS/0/SD_ILS:1683332024-09-06T22:07:18Z2024-09-06T22:07:18ZAuthor Rykov, V.V. editor. Balakrishnan, N. editor. Nikulin, M.S. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4971-5">http://dx.doi.org/10.1007/978-0-8176-4971-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysisent://SD_ILS/0/SD_ILS:1670302024-09-06T22:07:18Z2024-09-06T22:07:18ZAuthor Limnios, Nikolaos. author. Barbu, Vlad Stefan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-73173-5">http://dx.doi.org/10.1007/978-0-387-73173-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Shock and Damage Models in Reliability Theoryent://SD_ILS/0/SD_ILS:1754202024-09-06T22:07:18Z2024-09-06T22:07:18ZAuthor Nakagawa, Toshio. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-442-7">http://dx.doi.org/10.1007/978-1-84628-442-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability, Life Testing and the Prediction of Service Lives For Engineers and Scientistsent://SD_ILS/0/SD_ILS:1664112024-09-06T22:07:18Z2024-09-06T22:07:18ZAuthor Saunders, Sam C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-48538-6">http://dx.doi.org/10.1007/978-0-387-48538-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Stochastic Ageing and Dependence for Reliabilityent://SD_ILS/0/SD_ILS:1660172024-09-06T22:07:18Z2024-09-06T22:07:18ZAuthor Lai, Chin-Diew. author. Xie, Min. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-34232-X">http://dx.doi.org/10.1007/0-387-34232-X</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probability and Risk Analysis An Introduction for Engineersent://SD_ILS/0/SD_ILS:1847332024-09-06T22:07:18Z2024-09-06T22:07:18ZAuthor Rychlik, Igor. author. Rydén, Jesper. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-39521-8">http://dx.doi.org/10.1007/978-3-540-39521-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Inference for Change Point and Post Change Means After a CUSUM Testent://SD_ILS/0/SD_ILS:1652512024-09-06T22:07:18Z2024-09-06T22:07:18ZAuthor Wu, Yanhong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b100107">http://dx.doi.org/10.1007/b100107</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Analyzing Uncertainty in Civil Engineeringent://SD_ILS/0/SD_ILS:1810312024-09-06T22:07:18Z2024-09-06T22:07:18ZAuthor Fellin, Wolfgang. editor. Lessmann, Heimo. editor. Oberguggenberger, Michael. editor. Vieider, Robert. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138177">http://dx.doi.org/10.1007/b138177</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>