Search Results for El Hami, Abdelkhalak. - Narrowed by: Metrology
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dEl$002bHami$00252C$002bAbdelkhalak.$0026qf$003dSUBJECT$002509Subject$002509Metrology$002509Metrology$0026ps$003d300?dt=list
2026-06-03T19:06:40Z
Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
ent://SD_ILS/0/SD_ILS:596531
2026-06-03T19:06:40Z
2026-06-03T19:06:40Z
Author Dahoo, Pierre Richard. Pougnet, Philippe. El Hami, Abdelkhalak.<br/>Preferred Shelf Number QC88<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
ent://SD_ILS/0/SD_ILS:596749
2026-06-03T19:06:40Z
2026-06-03T19:06:40Z
Author Dahoo, Pierre Richard, author. Pougnet, Philippe, author. El Hami, Abdelkhalak, author.<br/>Preferred Shelf Number QC88<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>