Search Results for Electron microscopy -- Data processing. - Narrowed by: English
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dElectron$002bmicroscopy$002b--$002bData$002bprocessing.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026ps$003d300?
2026-03-07T11:45:44Z
Scanning transmission electron microscopy : advanced characterization methods for materials science applications
ent://SD_ILS/0/SD_ILS:565126
2026-03-07T11:45:44Z
2026-03-07T11:45:44Z
Author Bruma, Alina, editor.<br/>Preferred Shelf Number QH212 .S34 S33 2021<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429243011">https://www.taylorfrancis.com/books/9780429243011</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Correlative imaging : focusing on the future
ent://SD_ILS/0/SD_ILS:595487
2026-03-07T11:45:44Z
2026-03-07T11:45:44Z
Author Verkade, Paul, editor. Collinson, Lucy, 1974- editor.<br/>Preferred Shelf Number RB43.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119086420">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119086420</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computed electron micrographs and defect identification
ent://SD_ILS/0/SD_ILS:256160
2026-03-07T11:45:44Z
2026-03-07T11:45:44Z
Author Head, A. K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780720417579">http://www.sciencedirect.com/science/book/9780720417579</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>