Search Results for Electron microscopy. - Narrowed by: Microscopy.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dElectron$002bmicroscopy.$0026qf$003dSUBJECT$002509Subject$002509Microscopy.$002509Microscopy.$0026ps$003d300?2024-11-02T02:04:26ZBiological Low-Voltage Scanning Electron Microscopyent://SD_ILS/0/SD_ILS:1670082024-11-02T02:04:26Z2024-11-02T02:04:26ZAuthor Schatten, Heide. editor. Pawley, James B. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-72972-5">http://dx.doi.org/10.1007/978-0-387-72972-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>In situ hybridization in electron microscopyent://SD_ILS/0/SD_ILS:937712024-11-02T02:04:26Z2024-11-02T02:04:26ZAuthor Morel, Gerard. Cavalier, Annie, ort. yaz. Williams, Lynda, ort. yaz.<br/>Preferred Shelf Number QH 452.8 M67 2001<br/>Format: Books<br/>Availability Beytepe Library~1<br/>In situ hybridization in electron microscopyent://SD_ILS/0/SD_ILS:2877512024-11-02T02:04:26Z2024-11-02T02:04:26ZAuthor Morel, Gřard. Cavalier, Annie. Williams, Lynda.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420042504">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Scanning Transmission Electron Microscopy Imaging and Analysisent://SD_ILS/0/SD_ILS:1728022024-11-02T02:04:26Z2024-11-02T02:04:26ZAuthor Pennycook, Stephen J. editor. Nellist, Peter D. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-7200-2">http://dx.doi.org/10.1007/978-1-4419-7200-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Sample Preparation Handbook for Transmission Electron Microscopy Techniquesent://SD_ILS/0/SD_ILS:1724752024-11-02T02:04:26Z2024-11-02T02:04:26ZAuthor Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-5975-1">http://dx.doi.org/10.1007/978-1-4419-5975-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Sample Preparation Handbook for Transmission Electron Microscopy Methodologyent://SD_ILS/0/SD_ILS:1680962024-11-02T02:04:26Z2024-11-02T02:04:26ZAuthor Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-98182-6">http://dx.doi.org/10.1007/978-0-387-98182-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysisent://SD_ILS/0/SD_ILS:1677902024-11-02T02:04:26Z2024-11-02T02:04:26ZAuthor Echlin, Patrick. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-85731-2">http://dx.doi.org/10.1007/978-0-387-85731-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM)ent://SD_ILS/0/SD_ILS:3027702024-11-02T02:04:26Z2024-11-02T02:04:26ZAuthor Stokes, Debbie. Royal Microscopical Society (Great Britain)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470758731">http://dx.doi.org/10.1002/9780470758731</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=234350&ref=toc">http://www.myilibrary.com?id=234350&ref=toc</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10270670">http://site.ebrary.com/lib/alltitles/Doc?id=10270670</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEMent://SD_ILS/0/SD_ILS:1652202024-11-02T02:04:26Z2024-11-02T02:04:26ZAuthor Egerton, Ray F. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>