Search Results for Electron microscopy. - Narrowed by: Transmission electron microscopy. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dElectron$002bmicroscopy.$0026qf$003dSUBJECT$002509Subject$002509Transmission$002belectron$002bmicroscopy.$002509Transmission$002belectron$002bmicroscopy.$0026ps$003d300?dt=list 2026-01-15T11:45:00Z Basic techniques for transmission electron microscopy ent://SD_ILS/0/SD_ILS:251216 2026-01-15T11:45:00Z 2026-01-15T11:45:00Z Author&#160;Hayat, M. A., 1936-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123339263">http://www.sciencedirect.com/science/book/9780123339263</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Transmission electron microscopy in micro-nanoelectronics ent://SD_ILS/0/SD_ILS:305423 2026-01-15T11:45:00Z 2026-01-15T11:45:00Z Author&#160;Claverie, A. (Alain)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1117321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1117321</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118579022">http://dx.doi.org/10.1002/9781118579022</a> Safari Books Online <a href="http://proquest.safaribooksonline.com/?fpi=9781118579053">http://proquest.safaribooksonline.com/?fpi=9781118579053</a> Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118579022">http://onlinelibrary.wiley.com/book/10.1002/9781118579022</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118579053">http://proquest.tech.safaribooksonline.de/9781118579053</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Aberration-corrected analytical transmission electron microscopy ent://SD_ILS/0/SD_ILS:304138 2026-01-15T11:45:00Z 2026-01-15T11:45:00Z Author&#160;Brydson, Rik.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=693217">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=693217</a> John Wiley <a href="http://dx.doi.org/10.1002/9781119978848">http://dx.doi.org/10.1002/9781119978848</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Aberration-corrected analytical transmission electron microscopy ent://SD_ILS/0/SD_ILS:318971 2026-01-15T11:45:00Z 2026-01-15T11:45:00Z Author&#160;Brydson, Rik, editor, author.<br/>Preferred Shelf Number&#160;ONLINE(318971.1)<br/>Electronic Access&#160;<a href="http://lib.myilibrary.com?id=320457">Connect to MyiLibrary resource.</a> Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=693217">http://public.eblib.com/choice/publicfullrecord.aspx?p=693217</a> ebrary <a href="http://site.ebrary.com/id/10488537">http://site.ebrary.com/id/10488537</a> EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=509882">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=509882</a> John Wiley <a href="http://dx.doi.org/10.1002/9781119978848">http://dx.doi.org/10.1002/9781119978848</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Introduction to Conventional Transmission Electron Microscopy ent://SD_ILS/0/SD_ILS:235652 2026-01-15T11:45:00Z 2026-01-15T11:45:00Z Author&#160;De Graef, Marc.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1017/CBO9780511615092">Access by subscription</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists ent://SD_ILS/0/SD_ILS:560353 2026-01-15T11:45:00Z 2026-01-15T11:45:00Z Author&#160;Dong, ZhiLi, author.<br/>Preferred Shelf Number&#160;QD131 .D66 2022<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429351662">https://www.taylorfrancis.com/books/9780429351662</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Characterization of radiation-damage by transmission electron microscopy ent://SD_ILS/0/SD_ILS:544992 2026-01-15T11:45:00Z 2026-01-15T11:45:00Z Author&#160;Jenkins, M. L., 1949, author.&#160;Kirk, M. A., 1942-<br/>Preferred Shelf Number&#160;TA418.6 .J46 2001<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420034646">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Characterization of radiation-damage by transmission electron microscopy ent://SD_ILS/0/SD_ILS:538285 2026-01-15T11:45:00Z 2026-01-15T11:45:00Z Author&#160;Jenkins, M. L., 1949, author.&#160;Kirk, M. A., 1942-<br/>Preferred Shelf Number&#160;TA418.6 .J46 2001<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420034646">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/>